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Readers Top 5 News of last 30 days
News - Component TestNI enhances Test Management Software for Semiconductor Test22 March 2016 - National Instruments (NI) released the TestStand Semiconductor Module, which provides test system engineers with the software tools to quickly develop, deploy and maintain optimized semiconductor test systems. With the TestStand Semiconductor Module, engineers can now program lab characterization systems using the same programming paradigm they deploy on the factory floor with the Semiconductor Test System (STS), thus reducing the time required to correlate measurements. mmWave Contactor for high Frequency Testing in high Volume Production15 March 2016 - Multitest introduced an innovative contacting solution for testing of extremely high frequency semiconductors in high volume production. The Multitest mmWave Contactor offers field proven outstanding electrical performance while maintaining best mechanical characteristics. The hybrid contacting solution combines traditional spring probe architecture for low frequency and power I/O’s while incorporating a cantilever solution for the peripheral high frequency transceiver I/O’s. Tri-Temp MEMS Gravity Handler for MEMS Devices01 March 2016 - Microtec Fertigungs-GmbH (MICROTEC), a manufacturer of customer dedicated test handlers for the Semiconductor packaged device test market, announces successful installation of its customized MH250-EVO SP. The Gravity Handler is now processing engineering and qualification volumes of very small form factor MEMS packaged devices at a local Semiconductor fab in Germany. SoC Test Fixture offers 50 Percent more Application Space10 February 2016 - Advantest announced a new RECT550EX HIFIX (High-Fidelity Test Access Fixture) unit to enhance the capabilities of its T2000 system-on-chip (SoC) test platform in performing highly parallel testing. The RECT550EX HIFIX has 50 percent more application space and is capable of handling 30 percent more channels than the previous RECT550 HIFIX model, enabling highly parallel and simultaneous measurements. Source Measure Unit for Tests up to 10A and 1000 Watts02 February 2016 – Tektronix introduced an easy-to-use, graphical-based source measure unit (SMU) instrument for optimizing and characterizing high power materials, devices and modules. The Keithley 2461 High Current SourceMeter SMU Instrument offers advanced capabilities for creating precisely-controlled 10 amp/100 volt, 1000 watt high-current pulses that minimize power device thermal effects and maintain device integrity. Temperature and Pressure Stimulus Unit for Testing Pressure Sensors01 February 2016 - Advantest announced the new HA7200 temperature and pressure stimulus unit, designed to apply the precise temperature and pressure required for final testing of pressure sensors. Up to four sensors can be tested in a small chamber with the temperature controlled by the dual-fluid technology used on Advantest’s test handlers. The HA7200 allows temperature and pressure to be quickly adjusted with high precision, greatly improving the cycle time and accuracy of trimming and inspection processes. Multitest expands Contactor Portfolio for WLP / WLCSP Testing13 January 2016 - Multitest’s new Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting solutions. The Mercury 030 is designed to address the electrical requirements of today's test challenges, without sacrificing mechanical performance in an automated test environment. The Mercury 030 is a WLCSP fine pitch probe made using a Multitest proprietary process that produces a long life, high strength probe with gold plating. For high reliability, stability, and very low contact resistance contacting, the Mercury 030 has two flat surfaces moving in surface-to-surface contact. More Articles ...
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