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Readers Top 5 News of last 30 days
News - Component TestPXIe Multiport Vector Network Analyzer13 October 2015 – Keysight Technologies introduced a high performance PXIe multiport vector network analyzer, the M9485A VNA, designed for high-volume wireless component manufacturing of front-end modules, switches and filters used in mobile phones and base stations. The true multiport architecture provides best-in-class measurement speed up to 30 percent faster than competing offerings, while maintaining high dynamic range. 300 kHz LCR Meter with Sweep and Bin Sorting Functions05 October 2015 - B&K Precision introduced their new model 891 300 kHz bench LCR meter. This new compact, value-priced LCR meter can measure inductance, capacitance, and resistance with 0.05% best impedance accuracy over a fully adjustable test frequency range of 20 Hz to 300 kHz. With a 300-point linear and logarithmic sweep function, bin comparator, and versatile remote control interfaces, the 891 is suitable for characterizing components in laboratory, quality control and small volume production environments. Keithley reduces Test Times for Parametric Test System by 25 Percent28 September 2015 – Tektronix released a major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments. Multitest launches HC Contactor for high parallel Test09 September 2015 - Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test. High Bandwidth Semiconductor Test Probes01 September 2015 - Everett Charles Technologies (ECT) launched a new member of the versatile ZIP semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance. Pick and Place Handler for testing High Voltage Applications up to 10 kV21 August 2015 - Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The entire set up has been optimized to meet the challenges of cost-efficient and reliable high voltage testing. The Multitest high voltage solution will be deployed for the automotive market (hybrid cars) and for consumer market applications. Testing of DRAM Memory ICs with Data Rates up to 16 Gbps18 August 2015 – Advantest introduced a fast fully integrated memory test card, the HSM16G. The new card extends the high-speed testing capabilities of the company’s HSM series of testers to native 16 gigabits per second (Gbps) for at-speed testing of ultra-fast memory ICs. This new product launch makes Advantest the first ATE supplier to provide an integrated test solution that supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16 Gbps. More Articles ...
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