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Readers Top 5 News of last 30 days
News - Component TestPlatform for Wafer-Level Device Characterization29 May 2015 – Keysight Technologies unveiled WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components. By efficiently controlling all components in a wafer-level measurement system (instruments and wafer probers alike), WaferPro Express reduces measurement setup complexity and provides a unified platform for efficient automated measurement and data management. Semiconductor Circuit Analysis using Terahertz Technology27 May 2015 – Advantest developed a technology utilizing short-pulse terahertz waves for analysis of electrical circuits. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz to 1THz), and characterization and location of failures in chip circuits (TDT/TDR). The new technology overcomes the technical obstacles and prohibitive cost of existing technologies, and will contribute significantly to the development and wider adoption of these leading-edge devices. 4-port Broadband VNA System with Frequency Coverage from 70 kHz to 110 GHz20 May 2015 – Anritsu introduces the VectorStar ME7838A4 4-port broadband vector network analyzer (VNA) system that features the world’s widest differential broadband sweep from 70 kHz to 110/125 GHz and utilizes the smallest mmWave modules to conduct highly stable and fast measurements when characterizing differential devices. The new ME7838A4 allows to conduct differential measurements with great confidence in next-generation communications system designs. Teradyne launched new ETS-800 Test System19 May 2015 - Teradyne announced the availability of the ETS-800 test system designed to further drive down the cost of test in the linear, power and automotive markets. The system introduction coincides with the availability of a suite of instruments to address the requirements of the analog test market. System shipments began in the third quarter of 2014 and are in production at multiple customers. The platform delivers high test cell throughput for complex analog devices through a combination of unique ETS-800 capabilities. Pick-and-Place Handler offers one Insertion Multi-Temperature Testing15 May 2015 - The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites. The fast and accurate changes of the set temperatures are based on the chamberless soaking solution in the contact unit of the MT2168. Multipurpose Module for IC Failure Capture28 April 2015 — Cascade Microtech introduced a new Multipurpose Electromigration (MPEM) module featuring an intuitive, full-featured test suite for predicting the lifetime and reliability of copper interconnects in modern integrated circuits. Cascade Microtech’s new MPEM module offers researchers a broadly capable tool with multiple electromigration (EM) test applications in one convenient, low-cost, high-performance system. High g Sensor Test Module for Gravity Handler21 April 2015 - Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two axis testing with one single stimulation on a flexible and modular handler platform. The well-established “Shaker” module, which was originally available for the MT93xx only, is now also available for the flexible and modular MT9928 gravity handler. More Articles ...
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