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Readers Top 5 News of last 30 days
News - Component TestNew Loader for Test in Carriers19 March 2015 - Multitest launched the first InCarrierplus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrierplus is the new state-of-the art loading solution for test in carriers. It is designed to optimize the back-end process at high volume production sites. The InCarrierplus supports the device loading to carrier from standard back-end transport media in a most cost-efficient and productivity-oriented way. Overlay and Films Process Control Solutions for advanced IC Processes17 March 2015 - KLA-Tencor Corporation introduced two advanced metrology systems that support the development and production of 16nm and below IC devices: Archer 500LCM and SpectraFilm LD10. The Archer 500LCM overlay metrology system provides accurate overlay error feedback through all stages of the yield ramp, helping chipmakers resolve overlay issues associated with innovative patterning techniques, such as multi-patterning and spacer pitch splitting. High Volume Test and Calibration of Barometric Sensors24 February 2015 - Multitest introduced a new MEMS test and calibration solution for barometric sensors. InBaro provides a reliable multisite test and calibration for barometric pressure sensors and gas detection sensors for e.g. 144 and more devices in parallel with a maximum signal count of 2400 pins per insertion. It enables temperature test at a range form – 40°C up to +125°C with high temperature accuracy and stability. Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells10 February 2015 - The Multitest ATC option for the MT2168 pick-and-place handler offers a cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites. Multitest ATC is an easy add-on to the standard MT2168, which can be mounted and demounted effortless. Multitest ATC is an affordable, reliable and flexible solution for test development and high volume production. New Version of Automated Characterization Software for WLR and Power Semiconductor Testing09 February 2014 - Keithley released a new version of its Automated Characterization Suite (ACS) software with more support for the development and characterization of semiconductor power devices and wafer level reliability (WLR) testing. Also ACS now supports the Model 2657A High Power Source Measure Unit (SMU) Instrument's ability to source or sink up to 3,000V and the new 10kV Model 2290 Power Supply. Cascade Microtech introduces new Version of Probe Station Control Software06 February 2015 - Cascade Microtech announced Velox 2.0, the latest version of probe station control software. Combining the ease of Nucleus with the power of ProberBench, Velox 2.0 delivers new levels of test and measurement efficiency to accelerate time to job completion.
Advantest opens Registration for VOICE 2015 Developer Conference14 January 2015 – Advantest Corporation will hold its annual VOICE developer conference on May 12-13 at the Hyatt Regency Santa Clara in Silicon Valley, California and May 22 at the Radisson Blu Pudong Century Park in Shanghai, China. VOICE 2015 will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees. More Articles ...
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