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News - Component Test
Versatile RF Probes for Semiconductor Test13 October 2014 - Everett Charles Technologies (ECT) launches two new members of the ZIP probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.
Boston Semi Equipment creates independent ATE Organization06 October 2014 Boston Semi Equipment (BSE) has combined all of its automated test equipment (ATE) businesses under the Boston Semi Equipment brand name. Effective immediately, the Test Advantage Hardware and MVTS Technologies businesses will operate using the Boston Semi Equipment name. This follows the company's announcement in July that it was integrating all sales and service for ATE, Prober and Test Handler products into the Boston Semi Equipment field sales organization.
Full Two-Port 26.5 GHz Vector Network Analyzers fit in just one PXI Slot03 October 2014 – Keysight Technologies announced a series of one-slot PXI vector network analyzers that cover 300 kHz up to 26.5 GHz. The new analyzers offer the best PXI VNA performance on key specifications such as speed, trace noise, stability and dynamic range. This enables the PXI VNAs to perform fast, accurate measurements and reduce the cost-of-test by enabling simultaneous characterization of many devices – two-port or multi-port – using a single PXI chassis.
Advantest launches System for Semiconductor Packaging Inspection03 October 2014 – Advantest announced a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor packaging. The system is based on advances in Terahertz (THz) technology pioneered by Advantest. The TS9000 Mold Thickness Analysis (MTA) System is a new metrology tool that performs non-destructive analysis of the thickness of semiconductor packaging.
Cost-efficient Vector Network Analyzer for uni- and bidirectional Measurements01 October 2014 - The new R&S ZND vector network analyzer from Rohde & Schwarz features two test ports, and the base unit is designed for unidirectional measurements from 100 kHz to 4.5 GHz. Its easy-to-use options provide for flexible upgrades. The frequency range can be extended to 8.5 GHz, plus the instrument can be equipped for bidirectional measurements up to 4.5 GHz or 8.5 GHz. These functions can be locally activated.
aps Solutions enters into a distribution and service agreement with BE Precision Technology26 September 2014 - aps Solutions GmbH announces the signing of an agreement with BE Precision Technology, a manufacturer of Probe Card Analyzers for the Semiconductor probe card market.
PXI-based Semiconductor Test System22 September 2014 – National Instruments announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and increased throughput and can now perform both characterization and production with the same hardware and software tools. More Articles ...
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