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News - Component Test
Everett Charles Technologies releases new Material for ZIP Probes08 September 2014 - Everett Charles Technologies (ECT) releases the HyperCore material to the full ZIP product line. ZIP is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles and reliable contact.
Impedance Analyzer with 1MHz to 300MHz Operating Frequency05 September 2014 - Hioki launched the Impedance Analyzer IM7580, which can perform measurement at high frequencies of up to 300 MHz for measuring high-frequency electronic components. The instrument can significantly boost productivity for electronic component manufacturers thanks to its ability to test large volumes of components at measurement speeds as fast as 0.5 ms. MEMS Testing and Metrology Workshop at SEMICON Europa 201405 September 2014 - In cooperation with SEMI, MEMUNITY organizes the 2014 MEMS Testing and Metrology Workshop at SEMICON Europa in Grenoble. Attendees can discuss needs, challenges, and trends in MEMS development, testing, and metrology at a high level expert event.
Patterning Control Solution for Sub-20nm Design Nodes02 September 2014 - KLA-Tencor Corporation introduced the WaferSight PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system and the K-T Analyzer 9.0 advanced data analysis system. These three new products support KLA-Tencor's unique 5D patterning control solution, which addresses five elements of patterning process control—the three geometrical dimensions of device structures, time-to-results and overall equipment efficiency.
Strip Test for Automotive Applications28 August 2014 - In the past strip test was considered not to be appropriate for applications with high quality requirements – such as automotive or medical – because singulation of the packages would have to take place after testing. Multitest’s InCarrier concept overcomes these issues and combines the substantial advantages of the strip handling process with the quality driven advantages of the standard test handling process.
Engineering Test Station for Solid-State Drives (SSDs)18 August 2014 – Advantest introduced the next product in its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the flexible MPT3000ES engineering station. While using the same high-performance electronics and powerful software as the original MPT3000 unit, the new station features a small footprint configured to test up to eight SSDs in parallel. The system’s small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
Device Capacitance Analyzer for Power Circuit Design15 August 2014 – Agilent Technologies / Keysight Technologies introduced the industry’s first power device capacitance analyzer that automatically characterizes power device junction capacitances using real operating voltages. With the increasing use of power devices fabricated from emerging materials like SiC and GaN, switching power supplies are now operating at increasingly higher frequencies. As a result, accurate device capacitance characterization is more important than ever. More Articles ...
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