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Readers Top 5 News of last 30 days
- 05 July 2017 - Test and Measurement Solutions for E-Mobility
- 05 July 2017 - Signaling OTA Testing for IEEE 802.11 ac/n/a/g/b Devices
- 28 June 2017 - Power Measurement Software provides multi-unit PC Connectivity
- 28 June 2017 - RF and Protocol Conformance Tests of 3GPP-Compliant LTE Mobile Terminals
- 26 June 2017 - Automated 400G PAM4 Electrical Testing
News - Component Test
Contactor for Large I/O Count BGA Devices
09 June 2016 - Multitest launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. Based on the well-established Multitest QuadTech flat probe technology, the Atlas contactor combines advanced mechanical and electrical probe technology for improved functionality and performance in manual test and automated test.
100 kHz Handheld LCR Meter with 0.1% Accuracy
09 June 2016 - B&K Precision announced the expansion of its current 878B and 879B 40,000-count handheld LCR meters with the addition of a new 100 kHz model, the 880. This new portable LCR meter can measure inductance, capacitance, and resistance with 0.1% basic impedance accuracy. Offering many features typically found only in bench LCR meters, the 880 provides test frequencies up to 100 kHz, selectable test signal levels, and 4-terminal measurement capabilities.
USB Type-C Cable Assembly Compliance Testing
07 June 2016 – Keysight Technologies announced a new Method of Implementation (MOI) document for cable assembly compliance tests defined in Rev. 1.1 of the USB Type-C specification and Rev. 1.0 of the USB Type-C Compliance Test Specification (CTS). The USB Type-C MOI, together with a test package such as Keysight’s state file, works with the M937xA PXIe multiport vector network analyzer to provide the compliance test solution for USB Type-C cable assemblies. This step-by-step guide of measurement procedures for time and frequency domains simplifies compliance setup and testing.
New Kind of Analyzer for Advanced Device Characterization
19 May 2016 – Keysight Technologies introduced the world’s first analyzer enabling a minimum of 100-pA level dynamic current measurements with a maximum of 200 MHz bandwidth, 1 GSa/s sampling rate and 14- or 16-bit wide dynamic range. The Keysight CX3300 Series Device Current Waveform Analyzer is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices.
Pick-and-Place Handler offers advanced Temperature Control Features
04 May 2016 - The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio of advanced temperature control features of the MT2168, which include Active Temperature Control (ATC), Cold Test for Characterization on the ambient / hot base handler version and now the ASP.
Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories
25 April 2016 - Advantest introduced the new T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. As portable applications are booming, the global market for flash-memory test systems is projected to reach $148 million by 2018, according to market analysis firm VLSIresearch. Cost-effectively testing these non-volatile memories requires a versatile platform to enable a high return on investment (ROI) and reduce users’ financial risk.
aps Solutions represents Taiwanese Test Handler Manufacturer in Europe
06 April 2016 - aps Solutions GmbH (“APS”) announces a representitive and service agreement with Hon. Technologies („HONTECH“), a Taiwanese Test Handler provider focused on fully automated Semiconductor devices backend test applications. HONTECH is ranked in the top three of global test handler manufacturers for MEMS Test, standard Logic IC Test, System Level (Board Level) IC Test, Flash Card IC Test, Precision Chip Automatic Inspection (AOI) and Open-Short Test of strip/substrate & IC packages.
More Articles ...
- Semiconductor Device Modeling and Characterization Software Tool Suite
- Universal Analog Pin Module for Testing of Smart Devices
- NI enhances Test Management Software for Semiconductor Test
- mmWave Contactor for high Frequency Testing in high Volume Production
- Tri-Temp MEMS Gravity Handler for MEMS Devices
- SoC Test Fixture offers 50 Percent more Application Space
- Source Measure Unit for Tests up to 10A and 1000 Watts
- Temperature and Pressure Stimulus Unit for Testing Pressure Sensors
- Multitest expands Contactor Portfolio for WLP / WLCSP Testing
- Advantest extends EVA100 Product Family with Digital Solution
- aps Solutions signs Distributor and Service Agreement with Mechanical Devices Ltd.
- Memory Tester for Universal Flash Storage and PCIe BGA SSDs
- High Resolution Error Detection for Advanced ICs
- Production Test of Sensors, Analog and Mixed-Signal ICs
- Testing Cable and Filter Transmission Properties
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