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Readers Top 5 News of last 30 days
- 30 May 2018 - Software to simplify Development and Debugging of Automated Test Systems
- 23 May 2018 - Infrastructure for Deployed Systems Management
- 25 May 2018 - Over-the-Air (OTA) Integrated Test Solution for Antenna in Package
- 28 May 2018 - 2x2 MIMO Measurement Function for Evaluation of WLAN Equipment
- 04 June 2018 - PCI Express Test Solution with Multivendor Oscilloscope Support
News - Component Test
Cantilever Contactor Design for MCU and ASIC Testing
10 August 2017 - Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon fully supports the requirements of a high, stable and reliable production output at lowest cost of test.
Significant Reduction of Soaking Time during Temperature Tests
01 August 2017 - Multitest developed an enhanced Soak Booster option for its tri-temp handler MT9928. The Soak Booster cuts down the soak time by up to 50%. Multitest is currently the only company offering this kind of advanced technology for gravity handlers.
htt Group is official Rep of MPI Probecards Division in Europe, UK and Israel
31 July 2017 - htt Group and MPI Corporation announced a formal agreement for the distribution of MPI’s Probe Card Division products throughout Europe, UK and Israel. This agreement includes the installation of equipment, training and personnel for the repair support of MPI’s probe card product lines at htt’s facility in Dresden, Germany.
Testing High-Resolution Converters, Consumer Audio ICs and IoT Devices
13 July 2017 – Advantest Corporation has added a high-resolution, highly accurate mixed-signal channel card to its Wave Scale MX product family, extending the series’ range in testing analog-to-digital and digital-to-analog waveform converters. The new Wave Scale MX high-resolution card combines the industry’s highest parallel testing capability with the most reliable AC and DC performance.
Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories
04 July 2017 - Advantest launched the T5822 memory tester, the newest member of its T5800 product series, optimized for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The new tester offers high-voltage resources such a level driver and DC testing capability along with an economical compact test head. It also features a powerful memory repair analysis (MRA) capability to help customers maximize their yields.
Wireless Test System supports 802.11ax, Bluetooth 5, ZigBee and Z-Wave
20 June 2017 – NI (National Instruments) updated its Wireless Test System (WTS), NI’s solution for multisite automated testing of wireless devices. The latest release 1.3 of the WTS includes support for 8x8 multichannel configurations and custom 802.11ax test steps with device under test (DUT) control for efficient parallel test of new connectivity devices based on the IEEE 802.11ax draft standard (Draft 1.1). Additionally, release 1.3 of the WTS improves parallel test of Bluetooth 5 and low-power Internet of Things (IoT) standards, such as ZigBee and Z-Wave.
Advantest ships 5,000th V93000 Mixed-Signal Test System
15 June 2017 - Advantest has shipped its 5,000th V93000 test system to Integrated Device Technology, Inc. (IDT), a supplier of system-level semiconductor solutions. The recently installed system is equipped with the new DC Scale AVI64 universal analog pin card, Pin Scale 1600 digital cards and DC Scale DPS128 cards to meet IDT’s needs in new product markets.
More Articles ...
- Test of Pressure Sensors for Automotive Applications
- Advantest Europe and Nash Technologies team for Application Engineering Services
- Pick-and-Place Handler with additional Temperature Control Features
- Long-live Spring Probe with 500% for high Volume Production
- LCR Meter with up to 1 MHz Test Frequencies and 0.05% Accuracy
- Advantest extends EVA100 Measurement System
- Sensor Test Module for Twin Axis Stimulation
- High Multi-Site Test of Pressure Sensors
- Pick-and-Place IC Handler for High-Volume Production and Device Characterization
- Testing the transmission Quality of high-speed Link Cables
- Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices
- Pick and Place Handler for small Packages below 3 x 3 mm
- Wafer-Level Parametric Test Solution for Power Semiconductors
- Marvin Test Solutions expands Semiconductor Test Platform
- 2-Serial Contacts Gravity Handler
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