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Readers Top 5 News of last 30 days
- 03 April 2018 - Test of LTE Cat-M1 and NB-IoT Devices
- 28 March 2018 - WLAN Signaling Tester for IEEE 802.11ax
- 26 March 2018 - High Speed Probe Card with Data Rates up to 6 Gbps
- 26 March 2018 - Optical Spectrum Analyzer for use in Production
- 30 March 2018 - General Purpose Digitizers with Sampling Rate up to 125 MS/s
News - Component Test
Advantest ships 5,000th V93000 Mixed-Signal Test System
15 June 2017 - Advantest has shipped its 5,000th V93000 test system to Integrated Device Technology, Inc. (IDT), a supplier of system-level semiconductor solutions. The recently installed system is equipped with the new DC Scale AVI64 universal analog pin card, Pin Scale 1600 digital cards and DC Scale DPS128 cards to meet IDT’s needs in new product markets.
Test of Pressure Sensors for Automotive Applications
16 May 2017 - Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.
Advantest Europe and Nash Technologies team for Application Engineering Services
12 May 2017 – Advantest Europe GmbH and Nash Technologies GmbH announced a strategic partnership to develop solutions for test of semiconductor devices. Advantest’s SoC market share is growing significantly and customers demand solutions to test their devices on its leading V93000 and T2000 test platforms.
Pick-and-Place Handler with additional Temperature Control Features
26 April 2017 - The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is another feature to support the excellent temperature performance of the well-established MT9510 test handler. By applying thermal controlled air flow to the pins the ASP keeps the temperature contact pin in the socket at the set test temperature. ASP provides optimum thermal energy to device under test and reduces the energy losses during test significantly.
Long-live Spring Probe with 500% for high Volume Production
13 April 2017 - Everett Charles Technologies (ECT) successfully won a head-to-head evaluation using Z0-040 probes made with HyperCore material in a high volume production environment at a large Asian OSAT. The Z0 probes reached 250k insertions, more than a 500% increase of the probe life compared to the competitor’s spring probe while exceeding first pass yield expectations.
LCR Meter with up to 1 MHz Test Frequencies and 0.05% Accuracy
03 April 2017 - B&K Precision expanded its bench LCR meter family with the addition of two new models that extend the family's test frequencies up to 1 MHz. B&K Precision's new 894 and 895 bench LCR meters provide test frequencies from 20 Hz to 500 kHz and 20 Hz to 1 MHz, respectively, and can measure inductance, capacitance and resistance with 0.05% basic impedance accuracy.
Advantest extends EVA100 Measurement System
03 March 2017 – Advantest introduced the new HF-AWGD (high-frequency arbitrary waveform generator and digitizer) module to extend the capabilities of its EVA100 measurement platform to include high-resolution and high-speed analog devices. With the new module, the EVA100 system can measure all key parameters of mixed-signal, precision and standard analog semiconductors used in high-growth applications including on-board automotive electronics.
More Articles ...
- Sensor Test Module for Twin Axis Stimulation
- High Multi-Site Test of Pressure Sensors
- Pick-and-Place IC Handler for High-Volume Production and Device Characterization
- Testing the transmission Quality of high-speed Link Cables
- Low-Volume Testing of Highly Integrated Modules and System-in-Package (SiP) Devices
- Pick and Place Handler for small Packages below 3 x 3 mm
- Wafer-Level Parametric Test Solution for Power Semiconductors
- Marvin Test Solutions expands Semiconductor Test Platform
- 2-Serial Contacts Gravity Handler
- Measure and Model Device Noise across Wafers
- PXI based Digital Test Solution for Semiconductor
- High Volume Test of environmental Sensors
- High-Volume SSD Manufacturing Test
- Parameter Analyzer Reduces Characterization Complexity
- High Volume Testing of Fingerprint Sensors
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