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Readers Top 5 News of last 30 days
- 27 August 2017 - Accurate, Flexible Turnkey Solution for Antenna Measurement
- 27 August 2017 - Compact Vector Network Analyzer for S-Parameter Measurements
- 03 September 2017 - Multi-Functional Mixed Domain Oscilloscope
- 29 August 2017 - 6-Channel PXI Microwave Multiplexer
- 04 September 2017 - 3GPP RF/RRM Compliance Test for NB-IoT and Cat-M1
News - Component Test
Measure and Model Device Noise across Wafers
24 August 2016 – Keysight Technologies announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.
PXI based Digital Test Solution for Semiconductor
19 August 2016 - National Instruments (NI) announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE).
High Volume Test of environmental Sensors
17 August 2016 - Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas.
High-Volume SSD Manufacturing Test
16 August 2016 – Advantest Corporation ( introduced the MPT3000HVM system, providing a single platform to test the full range of SATA, SAS, and PCIe solid-state drives (SSDs), from the highest performance enterprise to the most cost-effective client SSDs. The MPT3000HVM achieves this optimal production test solution by leveraging the proven MPT3000 tester-per-DUT (device under test) architecture and unique hardware acceleration in a new high-density configuration.
Parameter Analyzer Reduces Characterization Complexity
11 August 2016 – Tektronix introduced the customizable and fully integrated Keithley 4200A-SCS parameter analyzer that accelerates semiconductor device, materials and process insights by reducing characterization complexity for new or sporadic users, simplifying test setup, and delivering clear, precise results. Building on the success of the Keithley 4200-SCS parameter analyzer, the new 4200A-SCS instrument features a new graphical user interface and a range of helpful self-learning tools such as expert instructional videos embedded into the instrument.
High Volume Testing of Fingerprint Sensors
02 August 2016 - Multitest’s InStrip has been selected to be the platform of a set up for high parallel testing of fingerprint sensors in China. The solution relies on Multitest’s well established and production proven InStrip / InCarrier, which is extended to fingerprint testing by a dedicated conversion kit (CK).
Cost-Effective Testing of RF Semiconductors
07 July 2016 - Advantest introduced its Wave Scale generation of channel cards for the V93000 platform, which delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal ICs for wireless communications. Designed for highly parallel multi-site and in-site parallel testing, the new V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF semiconductors while creating a path for testing future 5G devices.
More Articles ...
- Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages
- Advantest ships 800th V93000 Port Scale RF Tester
- Tri-Temp Gravity Handler supports SOT23 Packages
- Die-Level Handling System for KGD Test Strategy
- Contactor for Large I/O Count BGA Devices
- 100 kHz Handheld LCR Meter with 0.1% Accuracy
- USB Type-C Cable Assembly Compliance Testing
- New Kind of Analyzer for Advanced Device Characterization
- Pick-and-Place Handler offers advanced Temperature Control Features
- Cost-Efficient Testing of High-Volume, Cost-Sensitive Flash Memories
- aps Solutions represents Taiwanese Test Handler Manufacturer in Europe
- Semiconductor Device Modeling and Characterization Software Tool Suite
- Universal Analog Pin Module for Testing of Smart Devices
- NI enhances Test Management Software for Semiconductor Test
- mmWave Contactor for high Frequency Testing in high Volume Production
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