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News - Component Test
Impedance Analyzers with Flexible Frequency Options27 May 2014 – Agilent introduced the Agilent E4990A and E4991B impedance analyzers, specifically designed for R&D, quality assurance and inspection engineers characterizing and evaluating passive electronic components, semiconductor devices and materials. The analyzers provide unparalleled accuracy and the best performance in the industry with flexible frequency options, all at an affordable price.
Integrated Test Cell Using for MEMS-Based Sensors26 May 2014 - Advantest has installed a fully integrated test cell for final testing of MEMS-based sensors used in tire-pressure monitoring systems (TPMS) for China’s fast-growing automotive market. The test cell has been qualified and is now being used in volume production at the customer’s site in addition to being available at the customer’s outsourced semiconductor assembly and test (OSAT) partner.
Assembly and Test Line for e-Car Batteries20 May 2014 - IPTE Prodel has installed an automated assembly and test line covering the entire process for the efficient manufacture of high-performance batteries used in newly engineered battery-operated e-cars. The product manufactured, a polymer-ion battery pack, consists of two units weighing 80 kilograms in total that are finally securely placed into an aluminum casing. In additional to the various mechanical assembly steps the line also includes a variety of test stations for quality and reliability assurance.
LTX-Credence launches Tester for next Generation Low Cost RF Devices02 May 2014 - LTX-Credence Corporation announced the second generation X-Series PAx test system, the PAx-ac. The PAx-ac is specifically designed to deliver the lowest cost of test for high performance, high volume manufacturing of RF front end mobility devices designed for the 802.11ac 160MHz and LTE Advanced modulation standards.
MEMS Microphone Test Handler30 April 2014 - Multitest shipped the first MEMS Microphone Test Module that achieves a unique 65dbA signal to noise ratio over the whole frequency range of 20 Hz up to 20 kHz and sound pressure levels of > 130 dB. The total harmonic distortion at 1 kHz, 120 db is less than 1%. Depending on device size the sound pressure level is linear in a range of 20 Hz to 20 kHz.
Loudspeaker Test Solution to suit your Budget25 April 2014 - The RT-Speaker loudspeaker test system of NTi Audio is now available in three editions, graded on functionality and price. This allows to select the appropriate solution that fulfills individual loudspeaker testing requirements.
Vector Network Analyzer covers Frequency Range from 70 kHz to 145 GHz22 April 2014 – Anritsu Company introduced the VectorStar ME7838D broadband system that provides a frequency coverage of 70 kHz to 145 GHz in a single sweep using a coaxial test port. Also boasting best-in-class dynamic range, calibration and measurement stability, and measurement speed, the VectorStar ME7838D gives design engineers greater confidence when performing on-wafer device characterization at 70 GHz and beyond. More Articles ...
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