|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component Test
Network Analyzer for Active Device Tests with 8.5 GHz07 April 2014 – Agilent Technologies expanded its flexible PNA-X family of network analyzers with an 8.5 GHz model that more economically supports lower-frequency devices used in wireless communication applications (e.g., handsets, base stations, WLAN and other mobile communication devices). With low-noise amplifier tests there are typically multiple test stations, such as small signal gain/match, distortions and noise figure; the PNA-X integrates these test stations into one.
High-Volume Testing of Ultra-Fast SerDes Applications04 April 2014 - Advantest Corporation introduced its newest digital channel card, the Pin Scale Serial Link (PSSL) card, for at-speed characterization and volume production of today’s high-speed semiconductors. PSSL is the fastest fully integrated automated test equipment (ATE) instrument on the market, capable of data rates up to 16 Gbps.
SEMI expects 2014 Fab Equipment Spending to Increase 20-30 Percent03 April 2014 - The latest release of the SEMI World Fab Forecast reveals a 20 to 30 percent projected increase in fab equipment spending in 2014. The uptick to 30 percent depends on specific fab projects in the Europe/Mideast and Asia regions, as detailed in the report. For 2014, the report identified over 190 fab projects spending on construction and/or equipment and over such 250 projects in 2015 (including Discretes, LED, Analog and Logic fabs).
CAMTEK announces Semiconductor Inspection and Metrology Platform02 April 2014 – Camtek started the customer evaluation of its next generation Semiconductor Inspection and Metrology platform designed for the Advanced Packaging market. The new systems deliver unparalleled 2D and 3D inspection and metrology capabilities for wafers, both before and after testing, along the bumping process or after dicing.
Volume Manufacturing Test Solution for NFC Devices24 March 2014 - LitePoint released its LitePoint IQnfc, the first volume production-optimized test system designed to measure and verify the physical layer performance of Near Field Communication (NFC) enabled devices. Until today, the primary method for production testing of NFC-enabled devices such as smartphones was a “pass/no-pass” approach, often utilizing an off-the-shelf NFC card reader or “passive tag.” This method, however, provides little useful data about system performance, allows marginal or even defective devices to ship to consumers and offers no information about the failure mechanism of devices that do not pass the production test.
Breakdown Testing at up to 10kV20 March 2014 - Keithley Instruments introduced two high voltage power supplies optimized for high voltage device and materials testing and high energy physics and materials science research. The Model 2290-5 5kV Power Supply and Model 2290-10 10kV Power Supply are well suited for high voltage breakdown testing of power semiconductor components. This includes devices made of current- and next-generation wide-bandgap materials like silicon carbide (SiC) and gallium nitride (GaN), designed for use in "green", energy-efficient power generation and transmission systems and hybrid and all-electric vehicles.
Highest Density Power Supply with greater Voltage Range for Semiconductor Test18 March 2014 - Advantest Corporation has extended its V93000 capabilities with the introduction of its new DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |