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News - Component Test
XYZTEC appointed ODEOM as new distributor for Turkey10 February 2014 - Because of the increasing demand in Turkey for bondtesters, XYZTEC has appointed ODEOM Elektronik Sanayi as exclusive distributor. ODEOM has more than 20 years of experience in the SMT business and focuses on customer satisfaction, the best and fastest service and customer profitability.
Test Solution for DDR4 and LPDDR4 Memories with high Throughput07 February 2014 - Advantest Corporation announced its latest test solution for next-generation memory ICs that enable high-demand mobile applications and servers. With its highly parallel testing capabilities and full compatibility as an upgrade on Advantest’s widely used T5503 test platform, the new T5503HS offers industry-leading performance, high productivity and low cost of test within an upgradable design. 64-Channel General Purpose Module for Testing of Power Management ICs20 January 2014 - Advantest Corporation introduced a new 64-channel, general purpose voltage-current (VI) module for its production-proven T2000 test platform, offering the industry’s lowest cost of test for parametric testing of high-pin-count ICs used in power-management and automotive applications. Keithley enhances S530 Parametric Test System Capabilities17 January 2014 - Keithley Instruments introduced the latest upgrades to its S530 Parametric Test Systems. This includes the new S530 Diagnostics and System Verification Tool. This new GUI-driven tool expands diagnostic coverage for all system instrumentation and matrix pathways, providing greater confidence in the health of the system. The upgrade includes a variety of new measurement capabilities and added flexibility to the Keithley Test Environment (KTE). Image-Processing Unit for Testing CMOS Image Sensors20 December 2013 - Advantest Corporation has launched its new T2000 ISS IPE2 unit, significantly shortening the image-processing time needed to test the larger pixel sizes of today’s advanced CMOS image sensors used in smart phones, tablet computers, digital cameras and video camcorders. Reducing test cycle times results in a lower cost per device, which helps to make the end-user electronic products more cost competitive. Test Handler Solution for 3+2 Axis MEMS Magnetic Sensors17 December 2013 - Multitest shipped the first MEMS tri-temp test handler solution for 3-axis magnetometer plus 2-axis low g-test and calibration. The modular concept for sensor test equipment ensures the most economic equipment utilization. The system has been designed for the industrial and automotive market segments. Both require the highest accuracy and precision as well as the full temperature scope of ambient-hot-cold. High-Performance Test Handler for SoC Devices12 December 2013 - Advantest launched its newest test handler for system-on-chip (SoC) devices, the field-upgradable M4871 pick-and-place system. The handler integrates Advantest’s proven technology from the company’s existing product lines with advanced, new functions including visual alignment with high throughput, active thermal control using Advantest’s Tri-Temp capability and a new handler data visualization framework that enables users to conduct real-time monitoring of a test cell’s production status from any network-enabled connection. More Articles ...
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