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Readers Top 5 News of last 30 days
News - Component TestOn-Wafer Device Characterization Test Solution14 September 2022 - Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with an engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production. Laboratory and Production Line Testing of optical Fibers and Cables09 September 2022 - Yokogawa Test & Measurement launched the AQ7286A, AQ7286H, and AQ7286J optical time domain reflectometer (OTDR) units and the AQ3550 optical switch box for the AQ7280 OTDR series of high-performance fiber optic testing instruments. These new products are designed to be paired with an OTDR mainframe to create an AQ7280 modular OTDR, a high-performance testing instrument that is ideal for use in the optical fiber and cable evaluation process. The new AQ3550 optical switch box enables efficient switching between connections when evaluating fiber-optic cables on the production line. Power Choke Testers for Measurements up to 4kA/7.7kJ01 September 2022 - Saelig Company introduced the ed-k DPG Power Choke Tester family - a unique series of innovative measurement instruments for inductive power components, using currents up to 4kA and pulse energy up to 7.7kJ. The DPG series uses a large-signal impulse measuring method to provide a complete inductance curve as a function of the current L(i), or as a function of the applied time-voltage-integral L(∫Udt). This allows the saturation characteristics of a power inductor to be clearly seen very quickly. Other significant parameters are also available, including incremental inductance and secant or amplitude inductance (the ratio of the winding flux linkage over winding current), and many other variables. System-Level Testing of Memory ICs used in Automotive29 August 2022 – Advantest installed its first enhanced T5851-STM16G tester capable of nonvolatile memory express (NVMe) system-level test coverage at a major manufacturer of IC memory devices. By expanding the capabilities of its established T5851 platform, Advantest is now able to address the growing market for testing NVMe solid-state drives (SSDs) using ball-grid arrays (BGAs), which are seeing rapidly increasing use in automotive applications including autonomous vehicles. Vector Network Analyzers for mmWave Applications15 August 2022 - Rohde & Schwarz adds new models and options to the R&S ZNB vector network analyzer family, addressing applications in the mmWave range such as 5G at FR2 frequencies and applications in aerospace and defense in the Ka band. The R&S ZNB26 provides network analysis up to 26.5 GHz, and R&S ZNB43 extends the upper frequency of the midrange VNA family to 43.5 GHz. PCIe Gen 5 NVMe & CXL Device Testing11 August 2022 – Advantest announced that its MPT3000 solid state drive (SSD) test systems are can now test PCI Express fifth-generation (PCIe Gen 5) devices, including those utilizing the new Compute Express Link (CXL) interconnect standard. To help drive product introduction, qualification and volume production demands associated with PCIe Gen 5 NVMe & CXL devices, several leading memory device makers have purchased multiple MPT3000 products, including MPT3000ES engineering systems, MPT3000HVM high-volume manufacturing testers, and device interface boards. 170 GHz / 220 GHz Broadband Vector Network Analysis Solution21 July 2022 - Keysight Technologies, FormFactor, DMPI and Virginia Diodes have joined forces to deliver a new 170 GHz / 220 GHz Broadband Vector Network Analysis (VNA) Solution that shortens design and verification cycles for 5G and emerging 6G applications. The four companies have jointly developed this new VNA solution to provide on-wafer millimeter-wave component characterization under various conditions. It offers an advanced dynamic range, high output power and maximum stability More Articles ...
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