|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component TestWayne Kerr launches new entry level Products for Component Testing10 April 2013 - Wayne Kerr Electronics has established a new product line, eWayneKerr, that offers engineering and manufacturing firms an option to acquire low cost, yet feature rich test equipment at affordable prices. eWayneKerr employs a streamlined manufacturing process which allows it to build quality products with little overhead. All products sold through eWayneKerr are fully backed by Wayne Kerr Electronics. Background: Pulse Testing for emerging Non-Volatile Memory Technologies09.April 2013 - Peter J. Hulbert, product and applications development engineer for Keithley Instruments, explains the principles of pulse testing for electrical characterization of emerging non-volatile memory technologies (NVM). NVM technologies like phase-change memory (PCM/PRAM), charge trap flash (CTF/SONOS), resistive memory (ReRAM), ferro-electric memory (FeRAM), magneto-resistive memory (MRAM), and others might soon replace the conventional floating-gate flash memory technology used in digital cameras, MP3 players, and smartphones. Automated Characterization Software for High Power Wafer-Level Testing08 April 2013 - Keithley Instruments announced enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high power semiconductor characterization solutions. The ACS package is optimized for automated wafer-level parameter test applications, including automated characterization, reliability analysis, and known good die testing. Advantest enters MEMS Testing Market02 April 2013 - Advantest has entered the high-growth market for testing micro-electromechanical system (MEMS)-based sensors by installing V93000 Smart Scale systems at several of Freescale Semiconductor’s facilities around the world. In addition to using Advantest’s testers for engineering development at Freescale’s Sensor and Actuator Solutions Division engineering center in Tempe, Arizona, the semiconductor manufacturer has started to employ the V93000 platform in production testing of its newest generations of MEMS-based sensors being manufactured in Asia. Test Handler for Gesture Recognition IC14 March 2013 - Melexis, a mixed signal semiconductor manufacturer headquartered in Belgium, has chosen Multitest’s Standard MT9510 Pick and Place Test Handler for an infrared, light sensing application. Multitest cooperated closely with Melexis to successfully develop a dedicated conversion kit to support this sensor application by integrating a 3rd party stimulus provided by Melexis. Higher Throughput for Wafer Thermal Test07 March 2013 - ERS electronic GmbH, a supplier of thermal wafer chucks for semiconductor production, is broadening the range of applications for its proven air-only cooling technology. New products coming out this year from the German high-tech company will make the native advantages of this technology available to applications beyond those that originally made air-cooling so successful in semiconductor thermal test. Energy-saving Battery Testing28 February 2013 - The Energy-Pump-Charging-Discharging technology (EPCD) is a concept developed by FuelCon for minimizing the energy consumption in battery test fields. The TrueData-EPCD combines all functionalities and applications of a charge/ discharge unit for single cell testing with the innovative EPCD concept for resource-friendly operation of battery test fields enabling enormous energy cost savings with reduction of the test station operating costs up to 70 %. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |