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Readers Top 5 News of last 30 days
News - Component Test16-Channel PXI Device Power Supply17 January 2021 - Marvin Test Solutions released the new GX3116e, 16-Channel Device Power Supply (DPS) / Source Measure Unit (SMU). The GX3116e DPS is a high density, flexible multichannel semiconductor device power supply solution. True 4-quadrant operation, isolated outputs, ganging capabilities for higher current, and extensive health monitoring and alarms make this the ideal solution for a multitude of semiconductor test applications. Testing CIS Devices Used in high-resolution Smart Phones11 January 2022 – Advantest started shipping the fourth generation of its high-speed image-processing engine that applies heterogeneous computing technology to detect defects in the data output from today’s most advanced CMOS image sensors (CIS). When integrated on the proven T2000 ISS platform, the new T2000 IP Engine 4 (Image Processing Engine 4) system provides the optimal means of evaluating the latest high-resolution, high-speed CIS devices used in advanced smart phone cameras. Parallel Parametric Test System offers cost-effective Wafer Test10 January 2022 – Keysight Technologies announced the new Keysight P9002A parallel parametric test system, which provides high throughput and cost effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing. It features a flexible option structure for up to 100 channels parallel test resources, including test capabilities required for parametric tests at each test resource. Memory Tester for advanced DRAMs and NAND Flash Devices17 December 2021 – Advantest announced the newest cost-efficient, high-volume memory tester in its industry-leading T5800 product family. With its 5.4-Gbps operating speed and massive parallelism, the new T5835 system is a wide-coverage test solution for current and next-generation DRAM core and high-speed NAND devices. The T5835can handle 768 devices simultaneously for final package-level testing. Test Solution for NAND/Nonvolatile Flash Memory ICs08 December 2021 – Advantest Corporation introduced a new high-throughput memory tester for NAND flash devices that can perform functional testing of chips while delivering highly accurate timing, repeatability and failure detection. With data-transfer speeds that are more than five times faster than its predecessor, the new T5221 system is designed to improve production efficiencies while reducing test costs for wafer sorting, built-in self-testing (BIST) and wafer-level burn-in (WLBI). Probe Card Technology for PIC Wafer Level Testing22 November 2021 - Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the test ecosystem is still under development. Jenoptik provides an essential component for novel PIC wafer level tests with the opto-electronic UFO Probe Card. RoodMicrotec uses this technology and benefits from a fast and simple integration, high flexibility, and state-of-the-art test technology. Software-Based Functional Test for complex SoCs19 November 2021 – Advantest Corporation launched its new Link Scale family of digital channel cards for the V93000 platform, enabling software-based functional testing and USB/PCI Express (PCIe) SCAN testing of advanced semiconductors. The new cards address testing challenges that require these interfaces to run in full protocol mode, adding system-like test capabilities to the V93000. More Articles ...
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