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Readers Top 5 News of last 30 days
News - Component TestAutomated Test Cell for IC Testing07 December 2020 - Advantest and STMicroelectronics, a global semiconductor supplier, have jointly developed a fully-automated final-test cell system that improves overall equipment efficiency and quality in semiconductor test and packaging operations. The pilot system has been deployed at ST’s back-end fab in Muar, Malaysia. The advanced test cell is comprised of Advantest’s T2000 SoC test system and M4841 tri-temp automotive handler, equipped with a fleet of Autonomous Robotic Vehicles (ARVs) programmed to move trays of devices between the material repository and handler, all under the control of an ST Test Cell Controller (STCC). Parametric Test System for Wide Bandgap (WBG) Semiconductors19 October 2020 - Tektronix released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements. The S530 platform enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. This reduced overall cost of ownership profile helps manufactures meet aggressive price pressures in competitive new markets. Inline X-ray System for High-Throughput Wire Bond Inspection08 October 2020 – Viscom introduced the new X7056-II BO system, which inspects bond wires optically and radiographically in an inline system at maximum inspection depth, ensures comprehensive inspection of power semiconductors and encapsulated sensor elements alike. The new system effectively combines optical wire bond control with X-ray inspection to reliably and precisely inspect wire bonds – even enclosed ones – and concealed solder joints beneath chips. SoC Test System targeting advanced digital ICs02 October 2020 – Advantest announced its next-generation V93000 testers targeted at advanced digital ICs up to the exascale performance class. The systems’ new test heads incorporate Xtreme Link technology, and the EXA Scale universal digital and power supply cards that enable new test methodologies, lower cost-of-test and faster time-to-market. Advantest started Online Portal with Access to Digital Products and Web-Based Services06 August 2020 – Advantest Corporation introduced a new online portal enabling customers to place orders and get instant delivery of Advantest’s cloud-based services and software products, making these items available on demand, anytime and anywhere. Users can access the myAdvantest portal from any internet-connected device without having to install an app or software program. First VNA capable of 70 kHz to 220 GHz Measurements in a Single Sweep04 August 2020 – Anritsu Corporation demonstrated its unique new Vector Network Analyzer (VNA), which can make measurements from 70 kHz to 220 GHz in a single sweep. The ME7838G, together with MPI’s 200mm probe station, allows on-wafer measurements that span into the upper mmWave frequencies for more accurate device characterization. Terahertz System enables high Resolution Analysis of Circuit Faults28 July 2020 - Advantest Corporation initiated sales of its new TS9001 TDR System. The new system fully utilizes the company’s unique terahertz technology to enable non-destructive and high-resolution analysis on circuit faults in advanced semiconductor packages, such as flip chip BGAs, wafer level packages, and 2.5D/3D ICs. More Articles ...
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