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Readers Top 5 News of last 30 days
News - Component TestOptical Wafer Testing for uLEDs at a single Test Station17 July 2020 – Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all μLEDs on a wafer at a single test station. IC Memory Tester integrates Burn-In and Core Testing for 5G Product Development15 July 2020 – Advantest launched the new, highly versatile H5620ES engineering test system, designed for both high-speed burn-in and core testing of today’s DDR4, next-generation DDR5, and low-power, double-data-rate (LPDDR) devices in laboratory environments. By streamlining the number of accessories and reducing the time required between burn-in and core testing, the new H5620ES shrinks the cost of test for evaluating advanced memory devices used throughout 5G applications. Testing Wi-Fi 6E, Sub-8-GHz 5G, and IoT Semiconductors for Wireless Communications05 June 2020 – Advantest Corporation introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8 GHz. The new V93000 Wave Scale RF8 card, capable of both highly parallel multi-site and in-site parallel testing, reduces the cost of test and time to market for leading-edge radio-frequency (RF) semiconductors while also creating a path for testing future 5G-NR devices. Memory Tester integrates Burn-In and Memory-Cell Test Functions in One System04 May 2020 – Advantest Corporation introduced its new versatile, high-throughput H5620 memory tester that combines the capabilities to perform both burn-in and memory-cell testing for advanced DRAMs and LPDDR (low-power, double-data-rate) devices. Generating Current Pulses as short as 10usec27 April 2020 - Tektronix announced the new 2601B-PULSE System SourceMeter 10μs Pulser/SMU Instrument, integrating a high-speed current pulser with DC source and measurement functions in one instrument. The new system incorporates PulseMeter technology for sourcing current pulses as short as 10μsec at 10A and 10V without the need to manually tune the output to match device impedance up to 3μH. 5G Semiconductor Test Platform10 January 2020 - Keysight Technologies announced that its collaboration with Marvin Test Solutions, Inc. (MTS) has resulted in the development of a fast and accurate 5G semiconductor manufacturing test platform. The two parties focused on advancing beamformer integrated circuit (IC) test technology to help manufacturers of semiconductors accelerate the production of high performance 5G integrated ICs. Photonics On-Wafer Testing Solution03 December 2019 - Keysight, FormFactor and CompoundTek have jointly developed an advanced photonics on-wafer testing solution that delivers industry-first capabilities including automated alignment, simultaneous optical-optical and optical-electrical device tests. More Articles ...
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