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Advantest to showcase Cloud Testing Platform at SEMICON Europa 2013
08 October 2013 - Advantest Corporation will showcase its suite of semiconductor solutions, ranging from nanotechnology electron beam (EB) lithography to automatic test equipment and cloud testing services at the SEMICON Europa 2013 trade show, stand #1.207, Hall 1, October 8-10 in Dresden, Germany.
Advantest will highlight an industry-first cloud testing solution ideal for semiconductor design, electronic component R&D, prototype evaluation, failure analysis and academic research. The company will also display next-generation nanotechnology EB lithography for nano-patterning and defect review as well as its multi-vision 3D metrology technologies.
“For the first time at SEMICON Europa, Advantest will have dedicated displays for its nanotech and cloud testing technologies,” said Josef Schraetzenstaller, managing director and CEO of Advantest Europe. “These new additions align with the company’s strategic, proactive expansion into new markets, while continuing to invest in ATE solutions.”
In collaboration with the SEMICON Europa trade show, Advantest will present a number of technical papers on its cloud testing services, 3D metrology, MEMs, automotive and test leadership at EMTC and the Tech Arena:
EMTC, Tuesday, October 8
EMTC, Wednesday, October 9
TechArena, Wednesday, October 9
TechArena, Thursday, October 10
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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