This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - Component Test

Image-Processing Unit for Testing CMOS Image Sensors

20 December 2013 - Advantest Corporation has launched its new T2000 ISS IPE2 unit, significantly shortening the image-processing time needed to test the larger pixel sizes of today’s advanced CMOS image sensors used in smart phones, tablet computers, digital cameras and video camcorders. Reducing test cycle times results in a lower cost per device, which helps to make the end-user electronic products more cost competitive.

Advantest’s newest test module for its T2000 platform features an improved image-processing engine with a quad-core CPU. By incorporating four microprocessing cores, the flexible ISS IPE2 unit can assign an independent image-processing engine for each device undergoing simultaneous testing. This configuration can reduce test times by as much as 46 percent for high-end CMOS image sensors with higher pixel counts.

“Our new high-speed image-processing unit is designed to address the trend toward bigger pixels and higher image quality among CMOS image sensors,” said Satoru Nagumo, executive vice president of Advantest Corporation. “This system addresses a pressing industry need that exists today and which we expect to extend well into the future.”

The new T2000 ISS IPE2 unit is available now.

www.advantest.de/



Upcoming Events

EUROPEAN MICROWAVE WEEK 2017
Nuremberg (Germany)
08 to 13 October 2017

Social Media

twitter_follow_420x50px