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Keithley reduces Test Times for Parametric Test System by 25 Percent
28 September 2015 – Tektronix released a major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments.
The software upgrade for the S530 includes enhancements to system SMUs that reduce settling time associated with low current measurements. Faster current measurements result in faster overall system measurement speeds. New system measurement settings and streamlined software execution further improve system speed. The upgrade also includes integration of Tektronix’ newest Keithley digital multimeter (DMM) for faster low voltage and low resistance measurements.
S530 systems are optimized for use in production parametric test environments that typically accommodate a broad mix of products or wherever wide application flexibility and fast test plan development are critical. In addition to the 200V system configuration that is typically used for standard CMOS, bipolar, MEMS, and other relatively low voltage semiconductor processes, Keithley offers a unique 1kV version optimized for the difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS power devices demand.
KTE version 5.6 and the new system DMM will begin shipping worldwide with S530s in October 2015.
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