|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
News about Component Test
Optoelectronic Device Testing up to 110 GHz
27 October 2015 – Anritsu enhances its MN4765B series of O/E modules for the MS4640B VectorStar Vector Network Analyzer (VNA) family that creates a cost-effective and flexible solution for measuring 56 Gb/s components and transceivers used in telecommunications and data communications applications. The MN4765B module, combined with the MS4640B VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currently used in R&D and manufacturing environments.
Magnitude and phase characterization is acquired using a primary standard characterized by NIST and conducted in the Anritsu calibration lab. The result is improved measurement uncertainty when the MN4765B is used with VectorStar across the wide frequency range of the VNA. With the MN4765B module, the MS4640B can conduct highly accurate, traceable corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
The MN4765B optical modules are designed with an InGaAs photodiode that converts modulated optical signals to electrical signals. The photodiode has exceptional bandwidth response to 70 GHz and 110 GHz. Additional circuitry for temperature and bias stability are also incorporated into the modules.
Broadband Solution to be Available
Anritsu will also launch an option for the MN4765B that will allow the module to be used with the ME7838x series Broadband VectorStar VNA for accurate optoelectronic measurements over an industry-best 70 kHz to 110 GHz in the 1550 nm range. The broadband configuration extends the applications in which the optoelectronic solution can be used to universities and research labs. Because it uses a NIST-characterized photodiode as the primary standard, it is a superior approach to the current methods relying on a non-characterized diode resulting in uncertainties of 3-5 dB.
VectorStar VNAs provide more accurate measurements over single-sweep frequency ranges of 70 kHz to 20 GHz, 40 GHz, 50 GHz, 70 GHz, 110 GHz, 145 GHz and a variety of discrete bands to 1.1 THz. Unlike other VNA solutions on the market, the VectorStar family is built on a stable, modern platform that can be easily upgraded across a range of functionality and performance. The MS4640B VNA series offers a high level of performance, so device modeling engineers can accurately and reliably characterize their devices. R&D engineers can achieve the last fraction of a dB out of their state-of-the-art designs and manufacturing engineers can maximize throughput without sacrificing accuracy.
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
© All about Test 2016