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News about Component Test
Marvin Test Solutions expands Semiconductor Test Platform
12 September 2016 – Marvin Test Solutions expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system which offers PXI Express (PXIe) performance and expanded test capabilities for RF devices and SoC applications. The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.
“Our semiconductor customers asked for an alternative to big-iron ATE systems that would combine the features of high-end ATE with the open architecture and benefits of the PXI standard,” said Steve Sargeant, CEO of Marvin Test Solutions. “With the addition of the TS-960e platform which incorporates our advanced GX5296 digital subsystem, an innovative semiconductor software test suite, and an RF instrumentation option, we are able to offer our customers the flexibility and value of the PXI platform with the high-performance test capabilities typically found only in high-end ATE systems.”
A Performance Test Platform
The TS-960e platform combines 256, 125 MHz digital I/O channels with per-pin-PMU with multiple RF and analog test instruments in a single, 21-slot PXIe chassis. Available as a bench top or with an integrated manipulator, the TS-960e platform takes full advantage of the PXIe architecture to achieve a full-featured test solution for digital, mixed–signal or RF test applications.
High-Performance Digital Test and Comprehensive Software Tools
The GX5296 delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs - or for replacing legacy test systems. The GX5296 builds on the successful GX5295 digital subsystem , offering unrivaled timing, edge-placement, density, memory, and parametric measurement capabilities. When combined with MTS’ advanced semiconductor software suite that includes program development and debug tools, comprehensive file conversion tools for WGL, VCD/eVCD, STIL , and ATP formats, and semiconductor-specific test modules including Shmoo plots and IV curve, the TS-960e provides no-compromise digital / mixed-signal / RF test capabilities for component, SoC and SiP devices.
TS-960e RF Test Capabilities
The TS-960e is available with Keysight Technologies’ comprehensive portfolio of PXIe RF instrumentation which can address a wide range of RF applications including WLAN, Bluetooth, Cellular, EW, and RF transceivers. Available instrumentation options include Keysight Technologies’ vector transceiver, vector signal analyzers and generators, and vector network analyzer PXIe modules; offering wafer and packaged RF test capabilities from 9 KHz to 27 GHz. All of these modules as well Keysight’s VSA measurement application software are fully integrated with the TS-960e’s system software, ATEasy.
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