|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component Test
BGA Interposer Solution for Probing DDR4 Designs07 July 2014 – Agilent Technologies introduced two new interposer solutions for testing DDR4 and DDR3 DRAM designs with a logic analyzer. Both interposer solutions provide fast, accurate capture of address, command and data signals for debugging designs and making validation measurements. The Agilent W4633A BGA interposer is used with Agilent E5849A probes for high-data-rate DDR4 x4 or x8 DRAM designs. The Agilent W3636A BGA interposer allows engineers to probe DDR3 x16 nonstacked DRAM more than 2 G deep. As the industry transitions to DDR4 data rates up to 3.2 Gb/s, engineers working on next-generation memory systems – such as those used in servers and embedded devices – face significant challenges. Probing and accurate signal capture are becoming increasingly critical for debug and validation of new designs. Both interposer solutions provide direct access to the balls of the DDR4 x4 or x8 DRAM with low loading and minimal impact to signal integrity on embedded system design. The probe works in existing designs and eliminates the need for up-front planning or redesign. Both interposer solutions are designed to be used with the Agilent U4154A logic analyzer system, the world’s fastest logic analyzer with 4-Gb/s state speed and 2.5-GHz trigger sequence speed. The W3630A Series DDR3 BGA probes are used with oscilloscopes and logic analyzers to perform physical-layer and functional tests for data rates up to 2400 Mb/s with the U4154A logic analysis system. The U4154A logic analysis module with 4-Gb/s state speed and 2.5-GHz trigger sequence speed enables full capability so engineers can reliably trigger and capture DDR4 signals at 3.2 Gb/s. When used with the new DDR4 probing solution, the B4621B decoder and B4622B compliance software toolset, this module provides full test capability for system integration in the memory industry. The complete U4154A logic analyzer systems for probing DDR3 DRAM and both the Agilent DDR4 x4 /x8 DRAM probing capability and the Agilent W3636A DDR3 x16 DRAM probing capability can be ordered now. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |