|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component TestIncreased Test Coverage for SPEA Flying Prober System05 March 2018 - GOEPEL electronic extends the integration of Embedded JTAG Solutions to SPEA 4050 Flying Probe Systems. This enables the combination of the Boundary Scan test technology with the Flying Probe test. That makes the SPEA 4050 system a cost and time efficient test platform for electrical assemblies in production. The fully integrated software package provides the user with a convenient test development with dedicated interfaces for the data exchange of both systems. In production, the Boundary Scan Software SYSTEM CASCON is completely embedded in the Leonardo software from SPEA, from which the tests are initiated and the results are managed. SYSTEM CASCON then takes over the control of the test system and thus achieves a higher test coverage and test depth. For the operator nothing changes in the usual operating environment. www.goepel.com/ Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |