|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component TestNew Data Acquisition System automates and rapidly validates Designs23 November 2018 - Keysight Technologies announced the Keysight DAQ970A data acquisition system (DAQ) to speed test development times with rapid measurement and scan rates, expanded measurement types and ranges, as well as simple test sequence automation. To ensure effective testing of complex designs, fast measurements and data logging of multiple signal types is required. Keysight's DAQ970A provides test engineers with the widest range of measurement types and ranges, fast scan rates and simplified test automation. Keysight's DAQ970A leverages the company's BenchVue DAQ application software to facilitate rapid creation of automated tests, instrument control to set parameters and status alerts, and simple analysis of measurement results. Embedded test flow capabilities automate DAQ setups and measurements into test sequences, while a new, intuitive graphical front panel display offers self-guiding menus that enable test engineers to quickly perform all tasks directly from the instrument. "Testing products with greater functionality, in less time, requires the ability to sample more signals, faster," said Chris Cain, vice president of Keysight's Electronic and Industrial Solution Group Center of Excellence. "Precision measurements across a wide range of measurement types is mandatory. Keysight's DAQ970A solution enables engineers to substantially improve design validation through automated testing without programming, expanded measurement options, and fast scan rates." Keysight's data acquisition system improves design validation and speeds test development times with:
www.keysight.com/ Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |