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Probes for high-accuracy on-wafer Measurement from 220 GHz to 1.1 THz

31 July 2014 - Cascade Microtech launched the T-Wave series of waveguide probes for on-wafer probing of millimeter wave and sub-millimeter wave circuits. The new T-Wave probe series includes millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials with frequencies up to 1.1 terahertz.

Applications such as short-range communication, terahertz imaging, astronomy and other high-speed communications applications require the ability to characterize sub-millimeter wave devices with data that is accurate and repeatable.

Recent technology innovation in photonics and nanotechnology is enabling terahertz research which is being applied in many emerging technology sectors. Terahertz technology is finding use in an increasingly wide variety of applications: information and communications technology; biology and medical sciences; non-destructive evaluation; homeland security; quality control of food and agricultural products; global environmental monitoring; and ultra-fast computing among others. These applications present unique challenges, particularly with transmission line losses as testing approaches 600 GHz and beyond.

Significant progress has been made in terahertz band (300-3000 GHz) circuit fabrication, and continued growth in terahertz applications requires the availability of quality test and measurement equipment. Robust and calibrated on-wafer measurements of planar millimeter and sub-millimeter wave devices can significantly reduce the effort required to characterize a wafer of devices while increasing the accuracy of the measurement by eliminating errors and effects associated with fixtures.

Cascade Microtech now offers its new T-Wave probe series which includes millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials with frequencies up to 1.1 terahertz. The T-Wave probe’s innovative silicon probe tip is instrumental in achieving not only small pitches as narrow as 25 µm, but also delivers low contact resistance and insertion loss of less than 1.5 dB between 140 GHz and 220 GHz. The T-Wave probe has excellent tip visibility for accurate probe placement, and with easily replaceable probe tips, cost of ownership is significantly reduced.

"Our strategic MeasureOne collaboration with Dominion MicroProbes, Inc. has afforded us the opportunity to expand our probe product line to now address the challenges of the terahertz frequency spectrum while improving our customers' time to first measurement," said Debbora Ahlgren, vice president of marketing, Cascade Microtech, Inc. "Complete solutions incorporating the new T-Wave probe will enable customers involved in imaging, astronomy and high-speed communications to broaden the capabilities of their Cascade Microtech probe stations. When purchased as part of a comprehensive MeasureOne Terahertz Solution, Cascade Microtech offers Solutions Experts for installation, system integration, training and service."

www.cascademicrotech.com/



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