News - Component Test

Impedance Analyzer with 1MHz to 300MHz Operating Frequency

05 September 2014 - Hioki launched the Impedance Analyzer IM7580, which can perform measurement at high frequencies of up to 300 MHz for measuring high-frequency electronic components. The instrument can significantly boost productivity for electronic component manufacturers thanks to its ability to test large volumes of components at measurement speeds as fast as 0.5 ms.

Transmission lines that use high-speed differential transmission and other technologies to send and receive large amounts of data are relying increasingly on high-frequency designs. Electronic components such as common-mode filters and ferrite-core filters are employed to maintain signal quality while limiting noise on such lines, and the increasingly high speeds at which the lines operate demand higher-frequency designs for those components as well.

At the same time, increasingly compact power supplies are needed to facilitate the ongoing miniaturization of mobile phones and laptop computers. Increasing the switching frequency of DC-DC converters offers one means of accommodating such requirements, leading to higher-frequency designs for power inductors and other electronic components that are used in those power supplies.

Electronic component manufacturers that produce these parts need to perform measurement at high frequencies as part of the development process and in order to carry out shipping inspections. To increase production volume during shipping inspections, measuring instruments must operate at high speeds.

Based on these needs, Hioki developed an impedance analyzer capable of testing at high frequencies and high speeds.

The IM7580 can perform measurement at frequencies ranging from 1 MHz to 300 MHz. Operating in LCR Mode, in which measurements are performed at a single frequency, the impedance analyzer can be used to generate PASS and FAIL results during shipping inspections. Operating in Analyzer Mode, in which the frequency is varied while performing measurement, the analyzer can be used to evaluate characteristics in product development and a variety of other applications.

The IM7580 can perform high-speed measurement at speeds as fast as 0.5 ms (0.0005 sec.). For electronic component manufacturers that wish to test large volumes of parts more quickly, this speed advantage can yield a significantly boost to productivity.

In addition, measurement repeatability has been increased by a factor of 10 from the legacy Hioki model, enabling stable measurement, improving production yields, and boosting productivity.

Thanks to the instrument's half-rack size (215 [W] x 200 [H] x 268 [D] mm), two IM7580 units can fit into a standard-width rack.

LCR Mode, in which measurements are performed at a single frequency, provides comparator functionality for generating PASS/FAIL judgments for electronic components as well as bin functionality for sorting components. The comparator function allows customers to set upper and lower limits and then generates PASS/FAIL results based on those criteria. Where the comparator function generates judgments based on one set of criteria, the bin function allows users to set up to 10 sets of judgment criteria and then ranks parts accordingly.

Analyzer Mode, in which the frequency is varied while performing measurement, provides area and peak comparison functionality for generating PASS/FAIL judgments based on electronic components' frequency characteristics. Area judgment allows users to verify that measured values fall within a previously configured judgment area, while peak judgment allows users to detect resonance points based on previously configured upper, lower, left, and right limits.

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