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Everett Charles Technologies releases new Material for ZIP Probes

08 September 2014 - Everett Charles Technologies (ECT) releases the HyperCore material to the full ZIP product line. ZIP is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles and reliable contact.

HyperCore leverages ECT’s extensive knowledge of contact materials. This proprietary material possesses properties that prevent oxidation, ensuring premium performance throughout high volume production cycles. With its 600 Knoop hardness, HyperCore is inert to common wear related to contacting tough surfaces and abrasive cleaning.

Tony DeRosa, Senior Product Manager explains: “ECT’s ZIP probes architecture features an innovative design that provide for superior contact capability. All ZIP products have a large internal contact area resulting in low contact resistance, superior bandwidth and excellent conductance. HyperCore adds an advanced material option to expand the cost of test advantage. Hypercore ZIP probes present a new level of accuracy, scalability and performance in high volume semiconductor test.”

HyperCore is available as material option for all ZIP probes.

www.ectinfo.com/



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