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News - Component TestDigital Stimulus/Response Module for RF Chipset Test Systems27 March 2015 – Keysight Technologies introduced a high-speed, 16-channel PXIe digital stimulus/response module with a parametric measurement unit (PMU). The module provides fast and flexible RF chipset test emulation and device characterization for test engineers in design validation and production test. A powerful pattern cyclizer technology enables on-the-fly pattern creation for single site, or up to four independent multi-sites, with high-voltage channels and open drain pins for simultaneous device test. This saves the engineer valuable time during design validation and production test. “We are the first to deliver high-speed, flexible digital pattern generation with synchronized multi-site stimulus/response capability in the PXIe form factor,” said Keysight’s Mario Narduzzi, marketing manager, Software and Modular Solutions Division. “This is part of our continued effort to speed up validation and production test throughput for test engineers.” The Keysight M9195A PXIe digital stimulus/response module offers:
Keysight’s rapid repair turnaround, with industry-leading calibration core exchange strategy and standard three-year warranty, maximizes system uptime to reduce the total cost of ownership. Related Articles: |
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