News - Component Test

Contactor for Large I/O Count BGA Devices

09 June 2016 - Multitest launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. Based on the well-established Multitest QuadTech flat probe technology, the Atlas contactor combines advanced mechanical and electrical probe technology for improved functionality and performance in manual test and automated test.

With an optimal insertion force and a large compliance window, the Atlas provides ultra-stable contact resistance over hundreds of thousands of device insertions. The Atlas can be configured for use without a floating alignment plate. The low Atlas per pin insertion force significantly reduces insertion strain on automated test handling systems while making the Atlas easier to use in manual test.

Atlas’ mechanical integrity includes the controlled insertion forces that are determined by the compression of a precision alloy stainless steel spring. Properties of the spring are engineered to offer predictable long-term performance over a broad temperature range: -50° to +150° C along with a typical life of 500K insertions. Atlas 040 insertion forces are controlled to just 25 grams per pin.

The insertion loss of Atlas 040 is measured at 18.5 GHz @-1dB while the return loss is measures at 14.72 GHz @ -20dB. The Atlas’ bandwidth supports the spectral content of most high speed digital device for ensuring great signal fidelity for maintaining digital edge rates. With a test height of only 3.53 mm, the Atlas 040 has the bandwidth for obtaining superb signal fidelity.

The Atlas design combines fine pitch capability with reduced contact height, force, and no damage zone contacting to meet the contacting needs of next generation for advanced high-end digital devices with typically 600 to 5,000 ball count range.

Bert Brost, Product Managers, explains: “Currently the Atlas contactor supports pitches down to 0.4 mm. Soon we will launch the Atlas for 0.3 mm pitches continuing the miniaturization and advancement of our field proven QuadTech flat probe technology

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