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Non-contact Probing of Wafers

09 November 2017 - TeraProbes, Inc. and bsw TestSystems & Consulting announced that they have formed a Solution Partnership to bring the innovative non-contact probing technology to researchers and practitioners in 6 countries in the European Union, including Germany, Switzerland, Austria, Belgium, The Netherlands, and Luxemburg. Under the partnership, bsw TestSystems & Consulting will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in these 6 countries.

“We are very excited to offer our products to the EU market where there is clear and growing interest in the millimeter-wave and terahertz frequency applications. Our non-contact metrology approach eliminates key issues faced with on-waver device and integrated circuit characterization, and enables users to conduct accurate, reliable, and repeatable measurements at frequencies as high as 1 terahertz. With our fully-automated system, users can even characterize entire wafers without any intervention. And most important of all is: You don’t have to buy a single contact-probe ever again.”, said Kubilay Sertel, President of TeraProbes.

bsw TestSystems & Consulting is a turn-key measurement solution provider for the semiconductor, electronic and telecom industry as well as research and development institutes. “Our emphasis is on RF/µw techniques and high-speed digital, more specific on S-parameters, tuner measurement techniques for noise parameters and load-pull, signal Integrity applications, DC/CV parameter extraction and contacting/fixturing solutions. Therefore and together with our partners we support the full available frequency range from DC to THz. We are delighted to partner with TeraProbes, Inc. and very enthusiastic to support sales and service in the European Union”, added Roland Blaschke, President of bsw TestSystems & Consulting. With locations in Germany and The Netherlands bsw will support the German speaking D-A-CH countries, the BeNeLux and parts of Scandinavia.

TeraProbes, Inc. manufactures innovative, non-contact metrology systems for on-wafer device and IC characterization. The fully-automated contact-free probe stations eliminate the wear-and-tear and contact-repeatability issues that users face with analytical contact-probes. The non-contact probing systems readily cover 90GHz-1THz band for single-mode and pure differential-mode characterization. The fully-automated probe stations enable uninterrupted characterization of entire wafers.

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