News - Component Test

Test Solution for Advanced PCIe Gen 4 Solid-State Drives

06 August 2018 – Advantest introduced a fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) on the proven MPT3000 platform, the same tester used by leading manufacturers of PCIe Gen 3, SATA and SAS SSDs. The new, all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.

The MPT3000 platform can now cover all test insertions for PCIe Gen 4 devices – from engineering with the MPT3000ES to reliability demonstration testing (RDT) with the MPT3000ENV to production testing with the MPT3000HVM – without waiting for third-party PCIe Gen 4 SSD applications to be commercially available. It streamlines the transition to the next generation of devices by offering users a test flow that spans design to manufacturing and uses the same tester architecture and software as Advantest’s proven PCIe Gen 3 solution. This holistic solution gives SSD manufacturers the fastest, lowest risk path to market.

“To address the wide variety of SSD protocols and form factors, we offer our modular MPT3000 platform, which we have now enhanced to validate and test the newest generation of PCIe memories,” said Colin Ritchie, vice president of system-level test at Advantest. “This highly flexible system’s tester-per-DUT architecture and hardware-acceleration make it a single-system solution for virtually all engineering, volume production and BIST (built-in self-test) applications.”

MPT3000 PCIe Gen 4 products are now available and shipments to customers have begun.

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