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Increase Test Pad Lifetime by up to 100 Percent

21 February 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its proprietary DuraPad surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors.

Specifically, fine-pitch boards of 0.5 mm or below and boards for resistance sensitive testing are particularly vulnerable to pad wear. DuraPad brings substantial cost of test savings to high-volume production sites of array packages and WLSCPs.

Multitest has performed extensive pad wear analyses to understand the actual issues with established surface coatings and to be able to provide the DuraPad solution. The company’s unique product portfolio of handlers, contactors and boards, enabled the engineers to apply Multitest’s comprehensive knowledge of the mechanical interactions. The results were presented at BiTS 2010 and 2011. The papers are available for download from the company's website.

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