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Readers Top 5 News of last 30 days
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News - General T&M
Nordson Enhances Electronic Test and Inspection Capabilities
13 August 2010 - Nordson Corporation announced that it has formed a test and inspection group within its Advanced Technology segment to better leverage the competencies of its Nordson DAGE and Nordson YESTECH subsidiaries. The new group combines the expertise of Nordson DAGE, the industry leader in bond testing and X-ray inspection technology, and Nordson YESTECH, the leader in automated optical inspection (AOI).
Shorten Time to Market with Faster Test Bench Development
12 August 2010 – Mentor Graphics Corporation announced that collaborative efforts with National Instruments have resulted in a solution that provides test-oriented feedback to design teams at every step of the design process. The new SystemVision™ SVX Client environment for the NI LabVIEW software allows designers to develop their test bench against a virtual prototype based upon their specification, and then use the exact same test bench in the NI LabVIEW software on physical prototypes.
Tektronix Commits to 200 GHz SiGe Technology
11 August 2010 – Tektronix, Inc. announced that its next-generation, scalable, performance oscilloscope platform will make broad use of IBM 8HP silicon germanium (SiGe) technology. The 130 nanometer (nm) SiGe bipolar complementary metal oxide semiconductor (BiCMOS) foundry technology offers 2x performance over the previous generation — and targets delivery of oscilloscopes with real-time bandwidth beyond 30 GHz.
National Instruments Announces PXI RF Vector Network Analyzer
09 August 2010 – National Instruments introduced the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test.
30 MHz Function/AWG with Unparalleled Signal Accuracy
05 August 2010 - Agilent Technologies introduced the 33521A 1-channel function/arbitrary waveform generator and the 33522A 2-channel function/arbitrary waveform generator. The 33521A and 33522A are members of the Agilent 33500 Series family of function/arbitrary waveform generators and offer unparalleled signal accuracy.
NI LabVIEW 2010: New Functions and Faster Code Execution
03 August 2010 – National Instruments announced LabVIEW 2010, the latest version of the graphical programming environment for design, test, measurement and control applications. LabVIEW 2010 delivers time savings with new features such as off-the-shelf compiler technologies that execute code an average of 20 percent faster and a comprehensive marketplace for evaluating and purchasing add-on toolkits for easily integrating custom functionality into the platform.
National Instruments expands Embedded Vision System Offerings
20 July 2010 – National Instruments today announced the addition of Windows OS support and Camera Link connectivity for NI Embedded Vision Systems, providing manufacturing engineers and system integrators three new options to develop high-performance machine vision solutions.
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