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Measurement and Analysis of Flicker Noise

14 May 2014 – Agilent Technologies introduced the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer — a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Flicker noise has long been considered a critical characteristic of electronic devices. It significantly affects performance of circuits such as active mixers, voltage-controlled oscillators, frequency dividers, op amps and comparators, which are fundamental building blocks in RF, analog/mixed signal, and high-speed wireline communication applications. Flicker noise and RTN are also both sensitive indicators of semiconductor material and manufacturing processes. With the semiconductor industry continuing to advance new technologies, the need for lower-frequency noise has never been greater.

Agilent’s newest Advanced Low-Frequency Noise Analyzer is designed from the ground up to meet these new challenges. Its unique modular design allows it to minimize system noise, provide measurement capabilities at an ultra-low frequency, and offer the best high-voltage/high-current handling capabilities on the market.

“Over the past two decades, Agilent has provided the world’s top semiconductor material suppliers, foundries, integrated device manufacturers, and design houses with systems for low-frequency noise characterization,” said Brian Chen, device modeling planning manager at Agilent EEsof EDA. “Now, with the E4727A Analyzer, we’ve incorporated innovative measurement algorithms to deliver the industry’s fastest measurement speed to date and maximizing our customers’ return on investment.”

www.agilent.com/

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