News - General T&M

New Tip Style for Test Probes improves Performance and Reliability

30 October 2014 - Everett Charles Technologies (ECT) launches the new I40 tip style. The innovative geometry of the I40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper. Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear.

The I40’s advanced off axis tip geometry machining methodology was designed to improve tip wear and resistance to tip fracturing. I40 tip style offers a more robust probe design and a longer tip life. The I40’s straight shaft lance with a 40° facet combines the penetration capability of a sharp tip probe while providing added material behind the tip to increase strength.

I40 tip style is available for probes that meet the toughest challenges in PCBA test and industrial test while providing superior performance and reliability.

The I40 tip style is featured on ECT’s Metrix, LFRE and LFTL probe series.

www.ectinfo.com/

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