This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - General T&M

Characterization of Broadband Millimeter-Wave Designs

Keysight N5291A08 June 2017 – Keysight announced a broadband millimeter-wave network analyzer solution that delivers unparalleled system-level accuracy up to 120 GHz. The new Keysight N5290/91A solutions produce metrology-grade results that enable leading-edge developers to confidently characterize their millimeter-wave designs.

The new solution enhances device characterization and modeling by delivering exceptional stability and accuracy for on-wafer and connectorized measurements. Magnitude stability is less than 0.015 dB and phase accuracy is less than 0.15 degrees over a 24-hour period.

Leveraging Keysight’s proven expertise in metrology, the solution’s calibration capabilities are based on an improved-accuracy database that supports a 1.0 mm calibration kit (85059B) and a 1.0 mm verification kit (85059V). With this foundation, the new broadband millimeter-wave solution provides measurement results that are traceable to national metrology institutes.

Core elements of the system are a Keysight PNA or PNA-X network analyzer, along with N5293A Series compact frequency extenders and the N5292A test-set controller. To simplify benchtop measurements, engineers can mount the frequency extenders on an optional desktop positioner.

Ruggedized 1.0 mm test ports ensure repeatable connections that improve calibration uncertainty and therefore system-level measurement precision. Users can apply automatic fixture de-embedding to connectorized measurements or perform calibration at the probe tips during on-wafer measurements.

The optional 900 Hz start frequency, with Options 205 or 425, enables engineers to characterize the low-frequency performance of their devices. This is especially useful when measuring the low-loss transmission line structures that are commonly used in high-speed digital applications.

Keysight collaborated with solution partner Cascade Microtech to provide a complete wafer measurement solution (WMS) based on the N5290/91A and the Keysight W8580BP WaferPro Express Core Measurement Bundle (software, drivers and database). The WMS program provides guaranteed configuration, installation and support to reduce risk and accelerate time to first measurement.

The broadband millimeter-wave solution also supports a variety of Keysight’s proven measurement applications. Examples include complete characterization of amplifiers and frequency converters (gain compression software option), measurements of mixers and frequency converters (scalar mixer software option), and calibrated multi-channel spectrum measurements (extended spectrum analyzer software option).

Enhancing Usability with a Streamlined Workflow

Keysight is also introducing a multi-touch user interface (UI) for all models in the PNA Series of network analyzers. Updates to the UI include a 12.1-inch widescreen display; easy access to frequently used functions; quick setups using touch-activated tabbed softkeys and dialog menus; and intuitive single- and multi-touch gestures to drag-and-drop or magnify traces.

www.keysight.com/



Related Articles:

Upcoming Events

SPS/IPC/DRIVES 2017
Nuremberg (Germany)
28 to 30 November 2017
EMV 2018
Duesseldorf (Germany)
20 to 22 February 2018
Mobile World Congress 2018
Barcelona (Spain)
26 February to 01 March 2018

Social Media

twitter_follow_420x50px