Flexible Platform for Power Module Testing

17 November 2025 — Advantest announced the MTe power test platform. Designed with state-of-the-art Advantest technology, MTe provides significant footprint reduction and optimized resource distribution without performance degradation—a key enabler to attract major IDM and OSAT players. The MTe platform is able to address emerging wide-bandgap semiconductor (e.g., SiC and GaN) challenges, as well as the integration of digital IP cores on power devices (e.g., IPM and IPD), providing high bandwidth capture, best-in-class gate driver control, dynamic (and short-circuit) test up to 10kA, and flexible high-voltage digital capabilities.

"The MTe concept embodies our vision of making test easy by being scalable, flexible and sustainable," said Fabio Marino, managing director, CREA, an Advantest Group Company. "We provide our customers with a unified test solution that evolves with their production requirements, enabling a seamless transition from R&D to high-volume manufacturing, ensuring the highest levels of performance and reliability."

Aligned with Advantest's history of providing scalable test platforms, MTe distributed computing architecture provides significant multisite test efficiency, enabling a high-parallel-test solution with optimized throughput. The MTe platform is now available worldwide. Early evaluations by customers in automotive and industrial power applications have confirmed significant productivity and throughput gains compared with legacy testers.

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