News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.
13 April 2026 - Teradyne announced the launch of the Photon 100, a comprehensive opto-electric automated test platform purpose-built to accelerate high-volume silicon photonics (SiPh) and co-packaged optics (CPO) manufacturing. As demand for high-speed, energy-efficient optical interconnects surges, driven by AI and next-generation data centers, manufacturers face challenges in scaling SiPh and CPO to high volume manufacturing. By integrating industry-leading optical and electrical instrumentation with Teradyne’s proven UltraFLEXplus platform, Teradyne Photon 100 enables high-throughput, automated testing across all key manufacturing stages, including wafer, optical engine, and co-packaged module insertions.
Read more: Test Platform for Silicon Photonics and Co-Packaged Optics
06 March 2026 - Keysight Technologies announced its new graphics double data rate 7 (GDDR7) transmitter compliance solution, that accelerates validation of Joint Electron Device Engineering Council (JEDEC) standards for graphics and artificial intelligence (AI) applications. Growing demand for high-performance computing, gaming, and AI platforms is driving memory and GPU vendors to adopt GDDR7, but the transition is creating significant validation challenges.
04 March 2026 — SIGLENT Technologies releases SMM3000X Series Source/Measure Unit (SMU). SMM3000X features 6½-digit resolution, output capability of up to ±210 V DC voltage, ±3.03 A DC current, and ±10.5 A pulsed current, with programming and measurement resolution down to 10 fA / 100 nV, and a maximum acquisition rate of 100,000 points/s. The SMM3000X supports four-quadrant operation, enabling simultaneous sourcing and measurement for closed-loop source–measure operations on DUTs.
Read more: Source/Measure Unit for characterizing Semiconductors.
25 February 2026 - Neumonda will exhibit at embedded world 2026 and present its complete portfolio of next-generation DRAM test boards: Rhinoe and Octopus, and will reveal its newest platform, Raptor. In hall 1, booth 340, visitors will experience a live Raptor demo running full-speed tests on a GDDR5 component. In the live setup, Neumonda’s Raptor test platform will execute real-time test sequences that validate GDDR5 components under application-realistic conditions.
17 February 2026 – Hioki launched the RM3542C Resistance Meter, a new-generation tester engineered for high-speed, stable pass/fail judgment in the mass production of chip resistors, ferrite beads, and other passive components. Designed to meet the increasing demand for precision and productivity on automated lines, the RM3542C integrates Hioki’s new ΔR function for inter-process comparison and a built-in BIN (grading) judgment function, achieving both strict quality assurance and efficient operation. A newly developed Jumper Mode shortens representative takt time by approximately 76% (from 3.8 ms to 0.9 ms), dramatically enhancing throughput while maintaining consistent, reliable inspection.
