|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsFast Design-to-Automated Inspection Data Flow23 January 2013 - CyberOptics announces the close-to-immediate setup of PCBA inspection using Automated Optical Inspection (AOI) and Solder Paste Inspection (SPI) systems for new products in just one simple step. Programming automated inspection systems has been a long-standing bottleneck for the acceleration of the new product introduction (NPI) process; a barrier now removed using the Mentor Valor Process Preparation programing tool in conjunction with CyberOptics inspection systems. “Customers have told us that they now face higher mix production with increasing model variations and need to find a way to be agile to maintain their productivity levels going forward,” stated Shen Hwang Ting, AOI Product Manager of CyberOptics. “The solution with CyberOptics and Mentor Graphics now addresses this issue, enabling very rapid set-up of new and changed products, promoting an agile operational environment.” This unique solution utilizes advanced data exchange formats between the Mentor Graphics Valor Process Preparation engineering tool and CyberOptics systems. This enables programming and library preparation automation and optimization up-stream and off-line; intelligent design data and the central materials library utilization; and the Valor Part Library (VPL) for vast component shapes and attribute data. “Mentor’s unique position in providing a market-leading PCB design-through-manufacturing flow further extends the value of our intelligent and rich tools data through automation to the actual point of operation on the shop-floor,” commented Oren Manor of Mentor Graphics. “This differentiates our customers by enabling them to respond to market needs in terms of quality, delivery, and cost.” In an industry that is challenged to “make anything, anywhere, anytime,” the close integration of the Valor Process Preparation tool, with the Valor Part Library and CyberOptics inspection systems represents a significant step forward to meet current and future requirements. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |