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Readers Top 5 News of last 30 days
- 25 April 2019 - Optical Spectrum Analyzer for Production Test
- 26 April 2019 - PCIe 4.0 U.2/U.3 & M.2 Interposers for SSD Protocol Analysis
- 24 April 2019 - Portable Wi-Fi Spectrum Analyzer
- 30 April 2019 - High-speed Spectrum Analysis for Lab and Production
- 01 May 2019 - Ultra-fast, Inline, 2D Bottom-side Automated Optical Inspection System
Latest Test and Measurement News
Boundary Scan Test Function for SPEA Flying Probe Tester
17 May 2019 - Goepel electronics announced the availability of the SYSTEM CASCON integration for the SPEA Flying Probe system SPEA4080. This allows the current flagship of SPEA's Flying Probe series to be optimally extended with the capabilities of GOEPEL electronic's Embedded JTAG Solutions environment. Thus the user has access to all test functions, which he can execute directly on his SPEA4080 test system.
Testing of High-Res Audio ICs
16 May 2019 - Advantest introduced its GPWGD high-resolution module featuring the industry’s highest analog-performance digitizer, which supports testing of high-resolution audio digital-to-analog converters (DACs) embedded in power-management ICs (PMICs) as well as stand-alone high-resolution audio devices.
Dynamic Power Device Analyzer
15 May 2019 - Keysight Technologies announced a new dynamic power device analyzer with double-pulse tester (PD1500A) to deliver reliable, repeatable measurements of wide-bandgap (WBG) semiconductors, while ensuring the safety of the measurement hardware and the professionals performing the tests.
Automatic Defect Recognition Function for X-Ray Inspection System
14 May 2019 - Yxlon launched a new version of its Geminy-based high-resolution computed tomography system family. In addition the company introduced a new ADR function (Automatic Defect Recognition) for the YXLON Cheetah EVO Plus microfocus X-ray system , which is intended to ensure reliable test results and greater efficiency, particularly in the electronics sector.
Multi-Site Testing of 5G-NR mmWave Devices up to 70 GHz
13 May 2019 - Advantest extended its V93000 system to cost-efficiently test the next generation of 5G-NR radio frequency devices and modules on a single scalable platform. The new V93000 Wave Scale Millimeter solution has the high multi-site parallelism and versatility needed for multi-band millimeter-wave (mmWave) frequencies.
Digital Integrator for Rogowski Coils
10 May 2019 – LEM introduced the integrator AI-PMUL to complete its flexible clip-around Rogowski coil offering. AI-PMUL is a versatile digital signal conditioner of Rogowski coils secondary signal which offers a wide range of standard analogue True RMS and instantaneous outputs.
Fully automated 3-axis Video Measurement System
09 May 2019 - Vision Engineering launched the LVC400 fully automated 3-axis video measurement system. Ideal for measuring large components or multiple small components, quickly, easily and accurately, LVC400 offers faster measurement, high accuracy levels, and benefits from Vision Engineering’s consistent focus on ease of use for all of its products.
More Articles ...
- Millimeter Wave Noise Sources for Over-the-Air Testing of 5G Devices
- RF Microwave Circuit Design, Simulation and Measurement Teaching Solution
- Current Probe with high Interference Immunity
- Subpixel Metrology for mLED and AR/VR Displays
- Ultra-fast, Inline, 2D Bottom-side Automated Optical Inspection System
- High-speed Spectrum Analysis for Lab and Production
- Current Probe ranging from 30 A to Micro Currents
- PCIe 4.0 U.2/U.3 & M.2 Interposers for SSD Protocol Analysis
- Optical Spectrum Analyzer for Production Test
- Portable Wi-Fi Spectrum Analyzer
- EMI Receiver with Time Domain and Real Time Scan Capabilities
- SmartPhone controlled Spectroradiometer
- High Density Matrix Switch Card for Functional Test
- Testing Motor Windings by quantifying Response Waveforms
- Spectrum Analyzers with advanced Measurement Options and Pre-Amp
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