 |
 |
Main Menu
Newsletter
News Area
Info Area
Weblinks
Product Focus
Readers Top 5 News of last 30 days
- 20 December 2018 - Test Automation Platform certified for Medical Software Engineering
- 19 December 2018 - High Precision Dual-Channel DC Power Supply
- 18 December 2018 - Direction-finding Antenna for locating Signal Sources
- 10 January 2019 - Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
- 08 January 2019 - Compact JTAG/Boundary Scan Desktop Test System
Latest Test and Measurement News
Probe-2-Pad Inspection Station
16 January 2019 - aps Solutions developed a tool, that allows the user precisely to check the position of probe tips of a Probe Card versus the probe pads of a Semiconductor wafer. The tool allows to check the behavior of the probe tips under real touch-down conditions as well as investigation of probe tips or needle beams under a microscope.
Cable Tester supports 4-Wire Precision Resistance Measurement
15 January 2019 - CAMI Research, manufacturer of automation-ready cable and harness test systems, announced the CB53 connector motherboard that will convert a top-mounted standard 64-pin connector board test fixture into a 4-wire test fixture. Conversion is valid when the UUT connects directly into the standard board rather than via a flying lead or adapter cable and eliminates the need to otherwise create custom 4-Wire test fixtures.
Testing DDR4 Memory on Prototypes and Production PCBs
14 January 2019 – Engineers designing with Double Data Rate 4 (DDR4) memory devices can quickly deploy tests for shorts and opens on control, address and data lines with the boundary scan test (BST) tools of ASSET InterTech’s ScanWorks platform for fast test and programming.
Keysight launched new Service Model
11 January 2019 - Keysight Technologies announced KeysightCare, a new service model that offers design and test engineers dedicated, proactive support for instruments, software, and solutions. KeysightCare offers access to a range of resources and is available in three service levels.
Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
10 January 2019 – Advantest Corporation entered into a definitive agreement under which Advantest will acquire the commercial Semiconductor System Level Test business (“Test Systems”), a provider of system level test for semiconductor components and modules, from Astronics Corporation for $185 million, plus an earn-out payment of up to $30 million based on certain performance milestones.
Signal Generators for testing Automotive eCall-Systems
09 January 2019 - In cooperation with TeleOrbit and TeleConsult Austria IZT expanded the capabilities of its Signal Generators. For testing eCall systems the IZT S1000 / IZT S1010 Signal Generator can be combined with the GIPSIE software which was developed in cooperation with TeleOrbit and TeleConsult Austria. The solution offers a compact multi-channel high-performance platform for complex and versatile testing in one device.
Compact JTAG/Boundary Scan Desktop Test System
08 January 2019 - GOEPEL electronic has launched the third generation of its compact JTAG/Boundary Scan test and programming system JULIET. The new SERIES 3 now offers current and voltage measurement, discharge function and full support for the emulation technology VarioTAP among other things.
More Articles ...
- DisplayPort Verification Module with USB-C/eDP Support
- Test Automation Platform certified for Medical Software Engineering
- High Precision Dual-Channel DC Power Supply
- Direction-finding Antenna for locating Signal Sources
- Fast Production Test of UV-LEDs
- Stand-alone AOI System with 3D Camera Module
- Parametric Testing for Developing and Manufacturing Next-Generation ICs
- New Features and Functionality for NI LabVIEW NXG
- All-in-One 400GbE PAM4 BER Measurements
- Dual-Channel, Multi-Function Arbitrary Waveform Generators
- E-Mobility Tester offers combination of high and low voltage test
- Digital Oscilloscopes featuring 7 Measurement Functions
- JTAG/Boundary Scan Controller for Industrial Production Use
- Test of High-Voltage Semiconductors
- Test Solution for Radiation Measurements on 5G Devices
Related Articles:
Upcoming Events
Tag Cloud
RSS Feed
Subscribe to RSS Feed
Social Media
© All about Test 2018