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Readers Top 5 News of last 30 days
- 27 August 2017 - Accurate, Flexible Turnkey Solution for Antenna Measurement
- 27 August 2017 - Compact Vector Network Analyzer for S-Parameter Measurements
- 29 August 2017 - 6-Channel PXI Microwave Multiplexer
- 03 September 2017 - Multi-Functional Mixed Domain Oscilloscope
- 04 September 2017 - 3GPP RF/RRM Compliance Test for NB-IoT and Cat-M1
Latest Test and Measurement News
Signal and Spectrum Analyzer featuring 5 GHz Analysis Bandwidth
25 September 2017 -- Rohde & Schwarz is addressing the fast-growing demands for characterizing wideband components and systems by introducing the new R&S FSW-B5000 option. In combination with the R&S RTO2064 digital oscilloscope as an external digitizer, the R&S FSW85 signal and spectrum analyzer equipped with the new hardware option provides equalized 5 GHz signal analysis bandwidth.
Advantest opens Call for Papers for VOICE 2018 Developer Conference
22 September 2017 – Advantest Corporation issued an international call for papers for the VOICE 2018 Developer Conference focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and hot topics. The 2018 conference will return to the 2016 host cities of San Diego, CA and Hsinchu, Taiwan on May 15-16 and on May 23, respectively, under the unifying theme “Measure the Connected World…and Everything in It℠.”
Debugging and Offline Analysis of PAM4 Optical Devices
21 September 2017 – Tektronix introduced the new DPO7OE1, a calibrated optical probe and analysis software for use with real-time oscilloscopes. It is optical reference receiver (ORR) compliant for 28-GBaud PAM4 applications and supports IEEE/OIF-CEI standard specific measurements. This new solution complements Tektronix’ optical PAM4 analysis tools for sampling oscilloscopes, giving design teams efficient test solutions for all stages of the optical transmitter workflow.
High-Density Modular LXI Ethernet Reed Relay Matrix Modules
20 September 2017 – Pickering Interfaces introduced new High-Density Modular LXI Ethernet Reed Relay Matrices. The new Modular LXI Matrix Reed Relay Modules (model 65-22x) were originally designed to test Semiconductors at wafer and package levels. The Reed Relay Matrix solution combines Pickering’s LXI Modular Chassis (model 65-200) with their new plug-in matrix module range—providing access to all signal connections on 200 pin connectors.
High-Speed Data-Transfer for advanced Waveform Analysis
19 September 2017 – Anritsu introduces two new options for its Signal Analyzer/Spectrum Analyzer MS2850A to support high speed transfer of captured waveform data to an external computer for post processing and analysis. Combined with the 1-GHz capture and analysis bandwidth, the options expand the capability of the MS2850A to address the needs of emerging wireless networks, including 5G, where experimental and prototype waveforms are being analyzed using simulation and analysis software.
High Speed and High Resolution Solder Paste Inspection System
18 September 2017 - Mek (Marantz Electronics), launched their latest automated Solder Paste Inspection system. The Model S2 features patented third generation sensor technology that enables unique, simultaneous 2D and 3D inspection. It will be on display for the first time at Productronica in Munich, Hall A2 Booth 402. The new ISO-Spector S2 utilises the latest in 12 Mega Pixel camera technology. A fibre optic link allows for a 32 Gigabit image data transfer speed.
Integrated Cellular + WiFi Protocol Verification Solution
15 September 2017 - Keysight announced a solution that supports simultaneous cellular and WiFi testing. The T5510S Cellular + WiFi Emulation System is a powerful, flexible platform enabled by the combination of Keysight's UXM network emulator and the Ixia Solutions Group's Wave Test System. The result is an industry first—a test platform covering a complete cellular and WiFi system, from data traffic generation to physical transmission, layers 1 to 7.
More Articles ...
- Programmable High Voltage DC Power Supplies
- RF Contactor compensates for HIB Tolerances
- Ubi-Tech (3R) is Strategic Training Partner of Anritsu in UK and Ireland
- Accurate Milliohm Measurements with Temperature Compensation
- Waveform Analysis and Search Feature for Oscilloscopes
- Field Strength Measurement for LTE-TDD
- 3GPP RF/RRM Compliance Test for NB-IoT and Cat-M1
- Massively Parallel Test Fixture for Testing of Display Driver ICs
- Multi-Functional Mixed Domain Oscilloscope
- Interview: Innovating Impedance Measurement
- 6-Channel PXI Microwave Multiplexer
- I2C Exerciser Software supports queued Read & Write Transactions
- Compact Vector Network Analyzer for S-Parameter Measurements
- Accurate, Flexible Turnkey Solution for Antenna Measurement
- Solid-State-Drive Test Solution covers also BIST
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