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Readers Top 5 News of last 30 days
- 28 October 2019 - Software Suite streamlines Test Data Processing and Analysis
- 25 October 2019 - High-Volume Testing of SoC Devices for Automotive Applications
- 23 October 2019 - USB4 and USB 3.2 Protocol Verification
- 31 October 2019 - Differential Probes offer Flexibility and wide Bandwidth Range
- 29 October 2019 - Signal Quality Analyzer for PCI Express 4.0 Compliance Test
Latest Test and Measurement News
RIGOL expands popular Digital Oscilloscopes Series with 200MHz Model
21 November 2019 - RIGOL Technologies expanded their Oscilloscope Portfolio with the release of the new DS1202Z-E 200MHz Oscilloscope for only €339. The DS1202Z-E comes standard with 2 analog channels, 24 MPts of deep memory, a 60,000 frame segmented record mode, standard serial decode and triggering, high resolution FFT, 15 trigger types and 37 integrated measurement functions.
IPTE presented new Design and increased Standardization
20 November 2019 - IPTE Factory Automation, a supplier of automated production equipment for the electronics and mechanics industry, presented at prdouctronica its new product design. Besides the focus on the requirements of industry 4.0, a new optical design and the optimized mechanical design of the components of the machines, the new generation accelerates the standardization of the so called standard machines. This covers IPTE’s depanelers as well as IPTE’s mounting equipment.
Keysight launched next Generation of i3070 In-Circuit-Testers
19 November 2019 - Keysight Technologies announced the i3070 Series 6 In-Circuit Test (ICT) suite of solutions which enables electronics manufacturers to improve test throughput and the operational efficiency of their printed circuit board assembly (PCBA) manufacturing. Keysight 's i3070 Series 6 ICT features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements.
Semiconductor Test Contactor for HAST, HTOL and Burn-in
18 November 2019 –Yamaichi Electronics launched a new generation of its Y-RED semiconductor test contactors. With the experience of designing full- and semi-customised test contactors over decades, the new generation Y-RED combines the high-grade technology, standardised single parts and - as major highlight – the user-friendly mounting procedure.
Wideband Digitizer with 6.5 GHz Bandwidth and continuous Data Transfer
15 November 2019 - Teledyne SP Devices announced the ADQ7WB, a dual-channel 12-bit wideband digitizer with 6.5 GHz analog input bandwidth and 5 giga-sample per second (GSPS) sampling rate per channel. The wide instantaneous bandwidth and unprecedented dynamic performance combined with customizable real-time digital signal processing (DSP) and high data transfer rates makes it an ideal platform for satellite communication systems, radar, 5G, and more.
PAM4 Error Detector for evaluating 400 and 800GbE Transmissions
14 November 2019 – Anritsu Corporation launched its PAM4 Error Detector (ED), supporting market-leading 116-Gb/s bit error rate tests. This new module for the Anritsu Signal Quality Analyzer-R MP1900A series is the only instrument to achieve error-free measurement of PAM4 signals at 116 Gbit/s with industry-best operation bit rates and high Rx sensitivity. Combined with the previously released MP1900A series PAM4 Pattern Generator, the new module supports high-accuracy BER measurements of PAM4 signals.
Programmable DC Electronic Load for Voltages up to 800 V
13 November 2019 - GW Instek introduced the new PEL-3000H programmable DC electronic load, which not only inherited functions and features from the PEL-3000 series but providing three current ranges for all PEL-3000H series and adding voltage monitor BNC terminals on the front panel. The PEL-3000H series, a single-channel, programmable D.C. electronic load with 800V and 0.84A/μs current Slew Rate, is ideal for the test of the high voltage devices such as the EV & HEV in-vehicle chargers, DC/DC converters or high-voltage batteries.
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- Oscilloscope for wireless Measurements
- PXE EMI Receiver with Frequency Coverage up to 44 GHz
- Dual Band OTA Test Solution for Sub-6 GHz and mmWave 5G Designs
- Full 3D AOI Systems with Artificial Intelligence
- SMU Modules for Test Challenges involving low Current and high Capacitance
- Differential Probes offer Flexibility and wide Bandwidth Range
- Real-Time Spectrum Analyzer with advanced Analysis Capabilities
- Signal Quality Analyzer for PCI Express 4.0 Compliance Test
- Software Suite streamlines Test Data Processing and Analysis
- High-Volume Testing of SoC Devices for Automotive Applications
- Efficient Visualization and Analysis of real-time Hardware
- USB4 and USB 3.2 Protocol Verification
- Low Insertion Force Cable Test Interface Fixtures
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