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Readers Top 5 News of last 30 days
- 30 May 2017 - Unified Control of Inspection Systems
- 30 May 2017 - Tektronix enhances its isolated Probe System
- 12 June 2017 - Flying Test Systems increases Test Coverage with XJTAG
- 05 June 2017 - Enhanced Power Analyzer for 6-Phase Machines
- 07 June 2017 - NI unveils the next Generation of LabVIEW
Latest Test and Measurement News
Multi-Channel Signal Generation with up to 24 fully synchronous Channels
27 June 2017 - Advanced electronic systems are increasingly turning to parallel design architecture to increase their overall performance in applications such as MIMO, radar, quantum computing and multi-lane serial bus testing. To develop these systems, and those with similar multi-receiver/emitter or multi-sensor technology, it is helpful to have the ability to generate multiple synchronized waveforms. Fast Arbitrary Waveform Generators (AWGs) have become the instruments of choice as they allow easy and flexible signal generation.
Automated 400G PAM4 Electrical Testing
26 June 2017 – Tektronix expanded its line-up of PAM4 test solutions to include comprehensive 400G electrical compliance testing for OIF-CEI-56G VSR/MR/LR PAM4 standards. The new 400G-TXE software package runs on high-performance Tektronix DPO70000SX Real-Time Oscilloscopes; a lineup of models which go up to 70 GHz in bandwidth. The automated turnkey solution performs PAM4 compliance test sweeps in a single pass for shorter test times, more reliable and repeatable results, and greater ease of use.
Compact, Battery-powered Multi-Function Measurement Instrument
23 June 2017 - Yokogawa Meters & Instruments Corporation launched the DL350 ScopeCorder. Combining the strengths of an oscilloscope and a data recorder, the all-new DL350 features a built-in battery and a lightweight, space-saving design. The DL350 ScopeCorder offers the same high reliability and precision as the high-end DL850E and DL850EV models, yet is optimized for the performance testing and troubleshooting of products and equipment in the field.
Triple-Output Power Supplies with 80-W and 160-W Output
22 June 2017 – Keysight Technologies introduced the E36300 Series triple-output programmable DC power supplies. With a large color display, intuitive user interface, modern device connections via LAN (LXI, USB and optional GPIB), the E36300 matches the performance of more expensive system power supplies.
Portable Solution for Testing to 100G
21 June 2017 – Anritsu Corporation has released a 100G Multirate Module for its Network Master Pro MT1000A all-in-one tester supporting interface rates from 10 Mbps to 100 Gbps, and technologies including Ethernet, Optical Transport Networks (OTN), SDH/SONET, Fibre Channel, and CPRI/OBSAI. Integrating the new 100G module with existing OTDR and CPRI RF modules in the MT1000A main unit provides field engineers and technicians with the industry’s first handheld solution covering all current testing needs for data centers, and core, metro, access, mobile backhaul and mobile fronthaul networks.
Wireless Test System supports 802.11ax, Bluetooth 5, ZigBee and Z-Wave
20 June 2017 – NI (National Instruments) updated its Wireless Test System (WTS), NI’s solution for multisite automated testing of wireless devices. The latest release 1.3 of the WTS includes support for 8x8 multichannel configurations and custom 802.11ax test steps with device under test (DUT) control for efficient parallel test of new connectivity devices based on the IEEE 802.11ax draft standard (Draft 1.1). Additionally, release 1.3 of the WTS improves parallel test of Bluetooth 5 and low-power Internet of Things (IoT) standards, such as ZigBee and Z-Wave.
AXI System optimized for shorter Cycle Times and faster PCB Handling
19 June 2017 - GOEPEL electronic presents the latest version of the X Line · 3D, the inline X-ray system for high-performance 3D inspection in large-scale production. Improvements in hardware and new software functions ensure even higher test speeds and thus shorter cycle times. The X Line · 3D Series 300 offers improved PCB transfer, significantly reducing PCB assembly handling time. In addition, systems of the speed variant X40PLUS now capable of scanning speed of up to 510 mm/s during image acquisition.
More Articles ...
- IoT Carrier Acceptance Test System facilitates IoT Integration
- Advantest ships 5,000th V93000 Mixed-Signal Test System
- Mid-Range Oscilloscopes with 4, 6, or 8 FlexChannels and Touch Display
- Flying Test Systems increases Test Coverage with XJTAG
- Programmable DC Electronic Load for up to 350W
- NI unveils the next Generation of LabVIEW
- Characterization of Broadband Millimeter-Wave Designs
- Analog RF and Microwave Signal Generator with highest Phase Noise Performance
- Enhanced Power Analyzer for 6-Phase Machines
- USB-based 6 GHz Vector Network Analyzer
- Unified Control of Inspection Systems
- Tektronix enhances its isolated Probe System
- ATE Core Configurations simplify Standardization and reduce Integration Risk
- Antenna for 3D Measurements
- Anritsu appointed Testime Technology Ltd as a Distributor for the United Kingdom
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