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Readers Top 5 News of last 30 days
- 24 July 2018 - Boundary Scan Controller with WLAN Interface
- 25 July 2018 - Desktop Battery Tester for various Battery Types
- 31 July 2018 - SPMI Protocol Decode Option for Oscilloscopes
- 27 July 2018 - Combined Conformal Coating and Inspection System
- 30 July 2018 - Digitizers with up to 48 fully synchronized Channels
News - Component Test
Tri-Temperature Test of LED Devices in Volume Production
16 August 2018 - The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED devices with best temperature performance.
12.8 Gbps SerDes Test Instrument with high Channel Density
10 August 2018 - The new Xcerra HSI1x instrument for the Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such as MIPI, PCIexpress, VbyOne, HDMI and USB, found on the latest applications processors, flat panel display devices, and other high performance ICs.
Test Solution for Advanced PCIe Gen 4 Solid-State Drives
06 August 2018 – Advantest introduced a fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) on the proven MPT3000 platform, the same tester used by leading manufacturers of PCIe Gen 3, SATA and SAS SSDs. The new, all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.
Cantilever Contacting Solution for High Parallel QFP Testing
02 August 2018 - Xcerra’s new HD Kelvin contactor successfully passed a long term evaluation at a major IDM. The application deploys the HD Kelvin for a multisite Kelvin test of a QFP 100 package for the automotive market. Xcerra’s HD Kelvin fully supported the customer’s target to double the test sites and moreover significantly exceeded the customer’s expectation in terms of life span.
Desktop Battery Tester for various Battery Types
25 July 2018 - GW Instek launched a new series of desktop battery tester, the GBM-3000 series, which uses AC 1kHz as the test signal and measures battery’s voltage and internal resistance up to 300V (GBM-3300) and 80V (GBM-3080). The series features 3.5" TFT LCD, 4-wire measurement method, high-resolution (6-digit voltage / 5-digit resistance) measurement display capability, and independent GO/NOGO determination of voltage and resistance, various communications interfaces, etc.
aps Solutions signs Distribution and Service Agreement with MICROTEST
22 June 2018 - aps Solutions GmbH (APS) signed an agreement with Microtest S.r.l. (“MT”) from Italy. APS is appointed by MT to their exclusive distributor in the “D-A-CH” territory, which means Germany, Austria and Switzerland and to MT’s non-exclusive distributor in all other countries of the EU.
Over-the-Air (OTA) Integrated Test Solution for Antenna in Package
28 May 2018 - Multitest delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker. This integration of an OTA patch antenna into the leadbacker of a production pick and place handler is believed to be the first in the industry.
More Articles ...
- SourceMeter Instrument with 4 Channels in 1U Slot
- Pick-and-Place Handler Option for avoiding ESD Pre-Damages
- Floating Power Source for Testing Power-Management-ICs
- Quick and easy Test Socket Replacement
- High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories
- Testing Service for CMOS Image Sensor Wafers
- High Speed Probe Card with Data Rates up to 6 Gbps
- Test of 6DOF Gyro Sensors in Singulated Packages
- Contactors for Testing Wafer Level Chip Scale Packages
- Parametric Test Solution with “TRUE” Per-Pin Architecture
- Stimulus Test Cell for Differential Pressure Sensors
- Automated IC Handler with Thermal Control
- Final Test of singulated WLCSPs
- High Density PXI SMU for the Semiconductor Test System
- Testing Battery Voltage, Resistance, Capacitance, Reactance and more
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