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Readers Top 5 News of last 30 days
- 13 November 2019 - Programmable DC Electronic Load for Voltages up to 800 V
- 19 November 2019 - Keysight launched next Generation of i3070 In-Circuit-Testers
- 25 November 2019 - Inline X-ray System for Power Electronics
- 20 November 2019 - IPTE presented new Design and increased Standardization
- 21 November 2019 - RIGOL expands popular Digital Oscilloscopes Series with 200MHz Model
News - Component Test
Photonics On-Wafer Testing Solution
03 December 2019 - Keysight, FormFactor and CompoundTek have jointly developed an advanced photonics on-wafer testing solution that delivers industry-first capabilities including automated alignment, simultaneous optical-optical and optical-electrical device tests.
Semiconductor Test Contactor for HAST, HTOL and Burn-in
18 November 2019 –Yamaichi Electronics launched a new generation of its Y-RED semiconductor test contactors. With the experience of designing full- and semi-customised test contactors over decades, the new generation Y-RED combines the high-grade technology, standardised single parts and - as major highlight – the user-friendly mounting procedure.
High-Volume Testing of SoC Devices for Automotive Applications
25 October 2019 - Advantest expanded the range of its T2000 platform with the launch of two new modules and a test head designed specifically for high-volume testing of devices used in automotive applications. The new equipment is designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles, a market segment that is projected to have a 9.6 percent compound annual growth rate from 2019 to 2022.
Measuring and Evaluating Switching Parameters of SiC, GaN Power Devices
18 October 2019 - Tektronix announced a new software plugin for its AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods.
aps Solutions enters into Representative and Service Agreement with Hauman Technologies
17 October 2019 - aps Solutions GmbH (“APS”) announces a representative and service agreement with Hauman Technologies Corp., a Taiwanese Wafer Probe Station manufacturer, focused on Photonic application solutions. Taipei and Hsinchu based Hauman Technologies Corp. are in the auto-probing market since more than 30 years with expertise in fabrication of 4”~8” LED wafer Probers. Worldwide more than 3,000 units are already installed and the trend is increasing continuously.
FormFactor acquires FRT GMBH
16 October 2019 - FormFactor announced the acquisition of FRT, based in Germany. FRT is the one of the fastest growing metrology suppliers in the semiconductor industry, with revenues expanding at more than 75% compounded annual growth rate since its inception in 2016 to 2018. This acquisition strengthens FormFactor’s leadership in test and measurement by expanding its addressable market into 3D surface metrology and extending the optical applications scope of its existing Engineering Systems business.
RoodMicrotec appoints KERR as Representative in Italy
02 October 2019 – RoodMicrotec, an independent company for semiconductors supply and quality services, announced the appointment of KERR as sales representative in Italy. Mr. Andrea Stona, CEO of KERR s.r.l. and Mr. Jan de Koning Gans, Managing Director of RoodMicrotec GmbH, have signed a contractual agreement under which KERR will carry out the tasks of promotion and sales of the services offered by the RoodMicrotec in the Italian market.
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- XYZTEC adds two new European Distributors
- Bond Testers feature high Forces and large Working Area
- Scalable, flexible, and accurate Validation of complex Networking SoCs
- Electrode Resistance Measurement System for Lithium-Ion Battery Test
- Turnkey Production Tester for 5G beamforming ICs
- High-Speed Instruments for testing up to 112 Gbps (PAM4)
- Phase Noise Test System for testing RF and Microwave Designs
- Battery Pack Safety Test System
- Short Link between EDA Environment and Device Tester
- Testing of High-Res Audio ICs
- Dynamic Power Device Analyzer
- Multi-Site Testing of 5G-NR mmWave Devices up to 70 GHz
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