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Readers Top 5 News of last 30 days
- 29 March 2019 - Protocol Analyzer Platform for USB4 and Thunderbolt 3 Systems
- 27 March 2019 - EMI Pre-Compliance Analysis Option for Spectrum Analyzers
- 28 March 2019 - Two-Port Cable and Antenna Analyzer
- 03 April 2019 - X-ray Inspection Systems for the Semicon Industry
- 05 April 2019 - aps Solutions signs Distribution and Service Agreement with Everbeing International
News - Component Test
aps Solutions signs Distribution and Service Agreement with Everbeing International
05 April 2019 - aps Solutions GmbH (“APS”) announces a distributor and service agreement with Everbeing International Corp. („EBI“), a Taiwanese Analytical Probe Station manufacturer, focused on high precision and affordable probing solutions. The exclusive sales and service territories are D-A-CH (Germany, Austria and Switzerland) and the countries of Scandinavia.
X-ray Inspection Systems for the Semicon Industry
03 April 2019 - YXLON International, a division of the Swiss Comet Group, launched a range of X-ray inspection systems dedicated to the Semicon industry. These systems offer advanced automated 2D and 3D inspection of bumps and filled vias to locate, identify and measure failures, including non-wetted bumps, voiding and misalignments to the highest standard. In terms of resolution these systems are among the best on the worldwide market.
aps Solutions sells Chip contacting Technology of ProbeAce in Europe and Israel
19 March 2019 - aps Solutions GmbH (“APS”) announced signing a Memorandum Of Understanding (MOU) with ProbeACE („PA“), an innovative Japanese Probe Card manufacturer, for exclusive Distribution of PA’s contactor technologies in EU and Israel. ProbeAce recently announced their “Fine-Pitch Area-Array Probe-Unit”, a Contactor solution, which is focusing on the increasing market of IoT (Internet of Things) devices as the versatile multi-connection technology as well as FOWLP (Fan-Out Wafer Level Package) package testing.
Portable Functional Test Platform for 5G Devices
14 March 2019 - W2BI, Inc., an Advantest Group company and a provider of automated device testing solutions for the mobile industry, introduced the company’s new Micro Line Tester (MLT) MLT2000. This universal product for 5G device conformance and certification offers expandable multiple input/multiple output (MIMO), portability and the flexibility to support dual connectivity (4G and 5G) while supporting 3GPP and operator-specific test plans.
Flexible, Compact Wireless Data Logger
04 March 2019 - Advantest announced expanded overseas support for its AirLogger WM2000 series of wireless data loggers. Following the expansion of support to China and Vietnam, as announced in January 2019, the company also started support in the United States, EU and Thailand from February.
Multi-Site Test of Automotive and Industrial Power Devices
27 February 2019 - Automotive power electronics ICs are complex and have stringent test requirements. Typically this limits how many IC’s can be tested in parallel, and thus inhibits the cost-effectiveness of modern highly parallel manufacturing test strategies. The Diamondx platform of Cohu, with a range of power and automotive instrumentation featuring SmartMux, breaks this barrier and enables maximum efficiency.
Impedance Controlled Test Contactor for maximized RF Power Transfer
08 February 2019 - Cohu designed the ICON contactor specifically for maintaining the native impedance of the device–under–test (DUT) through the contactor to the test system. Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal.
More Articles ...
- Contactor for High Temperature Test
- Highly Parallel Testing of Next-Generation Universal Flash Storage and PCIe BGA SSDs
- Probe-2-Pad Inspection Station
- Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
- Fast Production Test of UV-LEDs
- Parametric Testing for Developing and Manufacturing Next-Generation ICs
- Test of High-Voltage Semiconductors
- Pattern Conversion Software for Cloud-Based Semiconductor Testing
- Switching Current Measurement for Memory Test Systems
- Memory Burn-In Testers for Next-Generation NAND Flash Memories
- Memory Burn-In Tester for NAND Flash and DRAM Devices
- Highly scalable Test Platform for Display Drivers
- Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration
- Battery Capacity Analyzer for sealed Lead Acid Batteries
- Tri-Temperature Test of LED Devices in Volume Production
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