News - Component Test

SourceMeter Instrument with 4 Channels in 1U Slot

KeithleyModel2606B 24 May 2018 – Tektronix unveiled the Keithley Model 2606B System SourceMeter instrument that packs four 20-watt SMU channels into a single 1U form factor chassis. Targeting the fast-growing 3D sensing manufacturing industry, the rackspace-saving Model 2606B combines the capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, and pulse generator into one tightly integrated instrument.

Pick-and-Place Handler Option for avoiding ESD Pre-Damages

Multitest MT2168 XT 16 May 2018 - The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards.

Floating Power Source for Testing Power-Management-ICs

Advantest FVI16 07 May 2, 2018 – Advantest extended the performance of its V93000 single scalable platform with the FVI16 floating power VI source for testing power and analog ICs used in automotive, industrial and consumer mobile-charging applications such as the growing e-mobility and rapid charger market. By supplying 250 watts of high-pulse power and up to 40 watts of DC power, the new source helps to provide sufficient power testing latest generation devices while conducting stable and repeatable measurements.

Quick and easy Test Socket Replacement

Multitest MT9928xm 04 May 2018 - Multitest’s Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted as the standard mounting solution by one of Multitest’s largest automotive customers. Quick Lock demonstrated substantial reductions in maintenance, debugging, and repair times.

High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories

Advantest T5503HS2 09 April 2018 – Advantest introduced its T5503HS2 memory tester, the industry’s most productive test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” in which global demand for memories is skyrocketing.

Testing Service for CMOS Image Sensor Wafers

Presto CMOS 30 March 2018 - Testing CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically for an array of large sensors or even sensors that are right up to the size of an entire 12-inch wafer.

High Speed Probe Card with Data Rates up to 6 Gbps

aps Sedicon 27 March 2018 - aps Solutions GmbH, an authorized distributor of Sedicon Technology from Korea, introduced a new solution for High Frequency Cantilever Probe Cards up to 10 GHz @-3dB or 6 Gbps. High quality Cantilever Probe Cards are offering many advantages for customers. Especially on cost of ownership, robustness, repair ability and delivery time Cantilever Probe Cards are unbeaten. Up to now, the frequency range of High Speed Probing was limited to test frequencies < 1 GHz.

Main Menu

Newsletter

News Area

Info Area

Weblinks

Product Focus

Readers Top 5 News of last 30 days

News - Component Test

SourceMeter Instrument with 4 Channels in 1U Slot

Pick-and-Place Handler Option for avoiding ESD Pre-Damages

Floating Power Source for Testing Power-Management-ICs

Quick and easy Test Socket Replacement

High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories

Testing Service for CMOS Image Sensor Wafers

High Speed Probe Card with Data Rates up to 6 Gbps

More Articles ...

Related Articles:

Upcoming Events

Tag Cloud

Social Media