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How to resolve AdBlock issue? Readers Top 5 News of last 30 days
- 03 March 2020 - Reducing Voids in Power Electronics with the Help of AXI
- 06 March 2020 - Signal Analyzer for Signals from 10 Hz to 50 GHz
- 10 March 2020 - Test Tools for 5G gNodeB Site Acceptance and Troubleshooting
- 04 March 2020 - 8-Channel Oscilloscope with flexible Resolution
- 05 March 2020 - Programmable DC Power Supplies up to 6,000 Vdc
News - Component Test
5G Semiconductor Test Platform
10 January 2020 - Keysight Technologies announced that its collaboration with Marvin Test Solutions, Inc. (MTS) has resulted in the development of a fast and accurate 5G semiconductor manufacturing test platform. The two parties focused on advancing beamformer integrated circuit (IC) test technology to help manufacturers of semiconductors accelerate the production of high performance 5G integrated ICs.
Photonics On-Wafer Testing Solution
03 December 2019 - Keysight, FormFactor and CompoundTek have jointly developed an advanced photonics on-wafer testing solution that delivers industry-first capabilities including automated alignment, simultaneous optical-optical and optical-electrical device tests.
Semiconductor Test Contactor for HAST, HTOL and Burn-in
18 November 2019 –Yamaichi Electronics launched a new generation of its Y-RED semiconductor test contactors. With the experience of designing full- and semi-customised test contactors over decades, the new generation Y-RED combines the high-grade technology, standardised single parts and - as major highlight – the user-friendly mounting procedure.
High-Volume Testing of SoC Devices for Automotive Applications
25 October 2019 - Advantest expanded the range of its T2000 platform with the launch of two new modules and a test head designed specifically for high-volume testing of devices used in automotive applications. The new equipment is designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles, a market segment that is projected to have a 9.6 percent compound annual growth rate from 2019 to 2022.
Measuring and Evaluating Switching Parameters of SiC, GaN Power Devices
18 October 2019 - Tektronix announced a new software plugin for its AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods.
aps Solutions enters into Representative and Service Agreement with Hauman Technologies
17 October 2019 - aps Solutions GmbH (“APS”) announces a representative and service agreement with Hauman Technologies Corp., a Taiwanese Wafer Probe Station manufacturer, focused on Photonic application solutions. Taipei and Hsinchu based Hauman Technologies Corp. are in the auto-probing market since more than 30 years with expertise in fabrication of 4”~8” LED wafer Probers. Worldwide more than 3,000 units are already installed and the trend is increasing continuously.
FormFactor acquires FRT GMBH
16 October 2019 - FormFactor announced the acquisition of FRT, based in Germany. FRT is the one of the fastest growing metrology suppliers in the semiconductor industry, with revenues expanding at more than 75% compounded annual growth rate since its inception in 2016 to 2018. This acquisition strengthens FormFactor’s leadership in test and measurement by expanding its addressable market into 3D surface metrology and extending the optical applications scope of its existing Engineering Systems business.
More Articles ...
- RoodMicrotec appoints KERR as Representative in Italy
- High-Frequency LCR Meter
- Chamber-Based Solid-State Drive Validation Tester with extreme Thermal Testing
- Clamshell Socket for 896 pin BGA Packages with Heat Sink
- XYZTEC adds two new European Distributors
- Bond Testers feature high Forces and large Working Area
- Scalable, flexible, and accurate Validation of complex Networking SoCs
- Electrode Resistance Measurement System for Lithium-Ion Battery Test
- Turnkey Production Tester for 5G beamforming ICs
- High-Speed Instruments for testing up to 112 Gbps (PAM4)
- Phase Noise Test System for testing RF and Microwave Designs
- Battery Pack Safety Test System
- Short Link between EDA Environment and Device Tester
- Testing of High-Res Audio ICs
- Dynamic Power Device Analyzer
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