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Readers Top 5 News of last 30 days
- 26 September 2019 - Forward Error Correction Test System for 400GE Devices
- 02 October 2019 - RoodMicrotec appoints KERR as Representative in Italy
- 03 October 2019 - Test Reference Architecture for Wi-Fi 6 Components above 6 GHz
- 30 September 2019 - IEEE 802.3cg 10BASE-T1S Compliance Test Solution
- 04 October 2019 - JTAG Isolation Adapter for ARM to protect Equipment
News - Component Test
Measuring and Evaluating Switching Parameters of SiC, GaN Power Devices
18 October 2019 - Tektronix announced a new software plugin for its AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods.
aps Solutions enters into Representative and Service Agreement with Hauman Technologies
17 October 2019 - aps Solutions GmbH (“APS”) announces a representative and service agreement with Hauman Technologies Corp., a Taiwanese Wafer Probe Station manufacturer, focused on Photonic application solutions. Taipei and Hsinchu based Hauman Technologies Corp. are in the auto-probing market since more than 30 years with expertise in fabrication of 4”~8” LED wafer Probers. Worldwide more than 3,000 units are already installed and the trend is increasing continuously.
FormFactor acquires FRT GMBH
16 October 2019 - FormFactor announced the acquisition of FRT, based in Germany. FRT is the one of the fastest growing metrology suppliers in the semiconductor industry, with revenues expanding at more than 75% compounded annual growth rate since its inception in 2016 to 2018. This acquisition strengthens FormFactor’s leadership in test and measurement by expanding its addressable market into 3D surface metrology and extending the optical applications scope of its existing Engineering Systems business.
RoodMicrotec appoints KERR as Representative in Italy
02 October 2019 – RoodMicrotec, an independent company for semiconductors supply and quality services, announced the appointment of KERR as sales representative in Italy. Mr. Andrea Stona, CEO of KERR s.r.l. and Mr. Jan de Koning Gans, Managing Director of RoodMicrotec GmbH, have signed a contractual agreement under which KERR will carry out the tasks of promotion and sales of the services offered by the RoodMicrotec in the Italian market.
High-Frequency LCR Meter
12 September 2019 - GW Instek launched a new series of high-frequency LCR tester. The LCR-8200 series has four models and the maximum test frequency is up to 30MHz. The entire series adopts 7-inch color display and features a high measurement accuracy (0.08%). The measurement results can be presented numerically or graphically according to the selected measurement mode, allowing users to optimally interpret the characteristics of the DUT.
Chamber-Based Solid-State Drive Validation Tester with extreme Thermal Testing
08 August 2019 - Advantest introduced the MPT3000ARC system, the newest member of its MPT3000 product family for testing and debugging solid-state drives (SSD). The fully integrated MPT3000ARC can operate over a broad temperature range to test all SSDs used in rapidly multiplying applications, including connected devices from smart cars to wearable electronics.
Clamshell Socket for 896 pin BGA Packages with Heat Sink
07 August, 2019 - Ironwood Electronics introduced a new high performance BGA socket for 1mm pitch BGA 896 pin Xilinx IC. The CG-BGA-4027 socket is designed for 31X31mm package size and operates at bandwidths up to 27 GHz with less than 1dB of insertion loss. The socket is designed with easy open clamshell lid mechanism enhances user experience when using high pin count devices in the socket. The socket also features integrated compression plate that retains force during various environmental conditions.
More Articles ...
- XYZTEC adds two new European Distributors
- Bond Testers feature high Forces and large Working Area
- Scalable, flexible, and accurate Validation of complex Networking SoCs
- Electrode Resistance Measurement System for Lithium-Ion Battery Test
- Turnkey Production Tester for 5G beamforming ICs
- High-Speed Instruments for testing up to 112 Gbps (PAM4)
- Phase Noise Test System for testing RF and Microwave Designs
- Battery Pack Safety Test System
- Short Link between EDA Environment and Device Tester
- Testing of High-Res Audio ICs
- Dynamic Power Device Analyzer
- Multi-Site Testing of 5G-NR mmWave Devices up to 70 GHz
- aps Solutions signs Distribution and Service Agreement with Everbeing International
- X-ray Inspection Systems for the Semicon Industry
- aps Solutions sells Chip contacting Technology of ProbeAce in Europe and Israel
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