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Readers Top 5 News of last 30 days
- 29 January 2019 - Keysight launched new 200 MHz, 4-channel Oscilloscopes
- 23 January 2019 - Predictive Maintenance for Inline AXI System
- 22 January 2019 - Frequency Response Analysis with Oscilloscopes
- 28 January 2019 - dSPACE partners with Radar Specialists miro·sys and ITS
- 24 January 2019 - Data Streaming and Visualization Service
News - Component Test
Impedance Controlled Test Contactor for maximized RF Power Transfer
08 February 2019 - Cohu designed the ICON contactor specifically for maintaining the native impedance of the device–under–test (DUT) through the contactor to the test system. Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal.
Contactor for High Temperature Test
25 January 2019 - Cohu’s new cDragon combines advanced test features at temperatures from -55 °C to +155 °C with best RF capabilities and an innovative pin design for highest test yield and low cost of ownership. The closed-loop Intelligent Contactor Option controls the required conditions for the device under test (DUT). cDragon’s compatibility with existing setups allows for fast and easy conversion.
Highly Parallel Testing of Next-Generation Universal Flash Storage and PCIe BGA SSDs
21 January 2019 – Advantest unveiled its new T5851 STM16G memory tester for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
Probe-2-Pad Inspection Station
16 January 2019 - aps Solutions developed a tool, that allows the user precisely to check the position of probe tips of a Probe Card versus the probe pads of a Semiconductor wafer. The tool allows to check the behavior of the probe tips under real touch-down conditions as well as investigation of probe tips or needle beams under a microscope.
Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
10 January 2019 – Advantest Corporation entered into a definitive agreement under which Advantest will acquire the commercial Semiconductor System Level Test business (“Test Systems”), a provider of system level test for semiconductor components and modules, from Astronics Corporation for $185 million, plus an earn-out payment of up to $30 million based on certain performance milestones.
Fast Production Test of UV-LEDs
17 December 2018 – Within its well-established CAS-series of spectroradiometers, Instrument Systems has developed a novel series-type CAS 140D-157. This new system measures precisely and reliably not only within the visible spectrum, but also in the UV. Coupled with a PTFE-coated integrating sphere, the system permits for fast 24/7 production tests of UV emitters to be run.
Parametric Testing for Developing and Manufacturing Next-Generation ICs
13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and monitoring needs for the exacting measurements required on the 28 nm to 3 nm process nodes and beyond. With per-pin source measurement units (SMU) for next-generation DC parametric testing, the system allows users to quickly measure and verify electrical and timing characteristics at any device pin, thereby enabling more cost-efficient manufacturing and faster time to market for new IC designs.
More Articles ...
- Test of High-Voltage Semiconductors
- Pattern Conversion Software for Cloud-Based Semiconductor Testing
- Switching Current Measurement for Memory Test Systems
- Memory Burn-In Testers for Next-Generation NAND Flash Memories
- Memory Burn-In Tester for NAND Flash and DRAM Devices
- Highly scalable Test Platform for Display Drivers
- Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration
- Battery Capacity Analyzer for sealed Lead Acid Batteries
- Tri-Temperature Test of LED Devices in Volume Production
- 12.8 Gbps SerDes Test Instrument with high Channel Density
- Test Solution for Advanced PCIe Gen 4 Solid-State Drives
- Cantilever Contacting Solution for High Parallel QFP Testing
- Desktop Battery Tester for various Battery Types
- aps Solutions signs Distribution and Service Agreement with MICROTEST
- Over-the-Air (OTA) Integrated Test Solution for Antenna in Package
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