News - Component Test

Memory Burn-In Tester for NAND Flash and DRAM Devices

Advantest B6700d 15 October 2018 – Advantest announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.

Highly scalable Test Platform for Display Drivers

Xcerra Diamondx IMAx1 08 October 2018 - Xcerra’s highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialized instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.

Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration

Multitest MT2168 XT 05 September 2018 - Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the Automatic Temperature Calibration enables the customer to meet quality standards by calibrating as scheduled without time consuming manual processes.

Battery Capacity Analyzer for sealed Lead Acid Batteries

BKP 603B 23 August 2018 - B&K Precision announced the next evolution of the 600 series, with the new 603B. The 603B handheld battery capacity analyzer tests 6 and 12 volt sealed lead acid batteries with capacities up to 100 ampere hour (Ah). Test results include voltage,state of charge, and internal resistance.

Tri-Temperature Test of LED Devices in Volume Production

Multitest MT9510 16 August 2018 - The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED devices with best temperature performance.

12.8 Gbps SerDes Test Instrument with high Channel Density

Xcerra Diamondx IMAx1 10 August 2018 - The new Xcerra HSI1x instrument for the Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such as MIPI, PCIexpress, VbyOne, HDMI and USB, found on the latest applications processors, flat panel display devices, and other high performance ICs.

Test Solution for Advanced PCIe Gen 4 Solid-State Drives

Advantest MPT3000 06 August 2018 – Advantest introduced a fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) on the proven MPT3000 platform, the same tester used by leading manufacturers of PCIe Gen 3, SATA and SAS SSDs. The new, all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.

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Readers Top 5 News of last 30 days

News - Component Test

Memory Burn-In Tester for NAND Flash and DRAM Devices

Highly scalable Test Platform for Display Drivers

Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration

Battery Capacity Analyzer for sealed Lead Acid Batteries

Tri-Temperature Test of LED Devices in Volume Production

12.8 Gbps SerDes Test Instrument with high Channel Density

Test Solution for Advanced PCIe Gen 4 Solid-State Drives

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