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How to resolve AdBlock issue? Readers Top 5 News of last 30 days
- 29 April 2020 - ModBUS-TCP Interface Option for programmable DC Power Supply Series
- 28 April 2020 - GW Instek launched new Entry-Level Digital Oscilloscope
- 27 April 2020 - Generating Current Pulses as short as 10usec
- 08 May 2020 - Tektronix extends Performance of TBS2000 Digital Storage Oscilloscopes
- 11 May 2020 - Uhnder and dSPACE Cooperate in Radar Technology
News - Component Test
Memory Tester integrates Burn-In and Memory-Cell Test Functions in One System
04 May 2020 – Advantest Corporation introduced its new versatile, high-throughput H5620 memory tester that combines the capabilities to perform both burn-in and memory-cell testing for advanced DRAMs and LPDDR (low-power, double-data-rate) devices.
Generating Current Pulses as short as 10usec
27 April 2020 - Tektronix announced the new 2601B-PULSE System SourceMeter 10μs Pulser/SMU Instrument, integrating a high-speed current pulser with DC source and measurement functions in one instrument. The new system incorporates PulseMeter technology for sourcing current pulses as short as 10μsec at 10A and 10V without the need to manually tune the output to match device impedance up to 3μH.
5G Semiconductor Test Platform
10 January 2020 - Keysight Technologies announced that its collaboration with Marvin Test Solutions, Inc. (MTS) has resulted in the development of a fast and accurate 5G semiconductor manufacturing test platform. The two parties focused on advancing beamformer integrated circuit (IC) test technology to help manufacturers of semiconductors accelerate the production of high performance 5G integrated ICs.
Photonics On-Wafer Testing Solution
03 December 2019 - Keysight, FormFactor and CompoundTek have jointly developed an advanced photonics on-wafer testing solution that delivers industry-first capabilities including automated alignment, simultaneous optical-optical and optical-electrical device tests.
Semiconductor Test Contactor for HAST, HTOL and Burn-in
18 November 2019 –Yamaichi Electronics launched a new generation of its Y-RED semiconductor test contactors. With the experience of designing full- and semi-customised test contactors over decades, the new generation Y-RED combines the high-grade technology, standardised single parts and - as major highlight – the user-friendly mounting procedure.
High-Volume Testing of SoC Devices for Automotive Applications
25 October 2019 - Advantest expanded the range of its T2000 platform with the launch of two new modules and a test head designed specifically for high-volume testing of devices used in automotive applications. The new equipment is designed to enhance test coverage, enable higher parallelism and reduce the cost of test for system-on-chip (SoC) devices used in automobiles, a market segment that is projected to have a 9.6 percent compound annual growth rate from 2019 to 2022.
Measuring and Evaluating Switching Parameters of SiC, GaN Power Devices
18 October 2019 - Tektronix announced a new software plugin for its AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods.
More Articles ...
- aps Solutions enters into Representative and Service Agreement with Hauman Technologies
- FormFactor acquires FRT GMBH
- RoodMicrotec appoints KERR as Representative in Italy
- High-Frequency LCR Meter
- Chamber-Based Solid-State Drive Validation Tester with extreme Thermal Testing
- Clamshell Socket for 896 pin BGA Packages with Heat Sink
- XYZTEC adds two new European Distributors
- Bond Testers feature high Forces and large Working Area
- Scalable, flexible, and accurate Validation of complex Networking SoCs
- Electrode Resistance Measurement System for Lithium-Ion Battery Test
- Turnkey Production Tester for 5G beamforming ICs
- High-Speed Instruments for testing up to 112 Gbps (PAM4)
- Phase Noise Test System for testing RF and Microwave Designs
- Battery Pack Safety Test System
- Short Link between EDA Environment and Device Tester
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