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Readers Top 5 News of last 30 days
- 15 November 2018 - Switching Current Measurement for Memory Test Systems
- 21 November 2018 - Imaging Automotive Radome Tester
- 16 November 2018 - 5G NR OTA Measurement Solution
- 19 November 2018 - Digitizers with ultra-long Signal Averaging Capabilities
- 20 November 2018 - Cellular Vehicle-to-Everything and Advanced Automotive Ethernet Test Solutions
News - Component Test
Parametric Testing for Developing and Manufacturing Next-Generation ICs
13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and monitoring needs for the exacting measurements required on the 28 nm to 3 nm process nodes and beyond. With per-pin source measurement units (SMU) for next-generation DC parametric testing, the system allows users to quickly measure and verify electrical and timing characteristics at any device pin, thereby enabling more cost-efficient manufacturing and faster time to market for new IC designs.
Test of High-Voltage Semiconductors
04 December 2018 – Advantest Corporation launched a new module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages.
Pattern Conversion Software for Cloud-Based Semiconductor Testing
27 November 2018 – Test Systems Strategies, Inc. (TSSI), a supplier of design-to-test pattern conversion, simulation and validation tools, and Advantest CloudTesting ServiceTM (CTS), developer of the semiconductor industry’s first on-demand testing service, announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.
Switching Current Measurement for Memory Test Systems
15 November 2018 – Advantest announced that a collaboration between the company and Tohoku University’s Center for Innovative Integrated Electronic Systems (below, Tohoku University CIES) has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM), a highly-anticipated next-generation memory technology, in units of microamperes and nanoseconds, using an Advantest memory test system.
Memory Burn-In Testers for Next-Generation NAND Flash Memories
05 November 2018 – Advantest launched two additional members of its next-generation B6700 family of burn-in memory testers. The new B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demand for server and mobile data-storage applications.
Memory Burn-In Tester for NAND Flash and DRAM Devices
15 October 2018 – Advantest announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
Highly scalable Test Platform for Display Drivers
08 October 2018 - Xcerra’s highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialized instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.
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- Tri-Temperature Test of LED Devices in Volume Production
- 12.8 Gbps SerDes Test Instrument with high Channel Density
- Test Solution for Advanced PCIe Gen 4 Solid-State Drives
- Cantilever Contacting Solution for High Parallel QFP Testing
- Desktop Battery Tester for various Battery Types
- aps Solutions signs Distribution and Service Agreement with MICROTEST
- Over-the-Air (OTA) Integrated Test Solution for Antenna in Package
- SourceMeter Instrument with 4 Channels in 1U Slot
- Pick-and-Place Handler Option for avoiding ESD Pre-Damages
- Floating Power Source for Testing Power-Management-ICs
- Quick and easy Test Socket Replacement
- High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories
- Testing Service for CMOS Image Sensor Wafers
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