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Readers Top 5 News of last 30 days
- 27 August 2017 - Accurate, Flexible Turnkey Solution for Antenna Measurement
- 27 August 2017 - Compact Vector Network Analyzer for S-Parameter Measurements
- 29 August 2017 - 6-Channel PXI Microwave Multiplexer
- 03 September 2017 - Multi-Functional Mixed Domain Oscilloscope
- 04 September 2017 - 3GPP RF/RRM Compliance Test for NB-IoT and Cat-M1
News - Component Test
Advantest opens Call for Papers for VOICE 2018 Developer Conference
22 September 2017 – Advantest Corporation issued an international call for papers for the VOICE 2018 Developer Conference focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and hot topics. The 2018 conference will return to the 2016 host cities of San Diego, CA and Hsinchu, Taiwan on May 15-16 and on May 23, respectively, under the unifying theme “Measure the Connected World…and Everything in It℠.”
RF Contactor compensates for HIB Tolerances
13 September 2017 - Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending design adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.
Massively Parallel Test Fixture for Testing of Display Driver ICs
05 September 2017 - Advantest introduced the RND440 Type 3 fixture, an optional enhancement on its T6391 display driver IC (DDI) tester that makes the system capable of massively parallel testing of chip-on-film (CoF) packages for the latest generation of smart phone screens. The unit is designed to handle the growing number of pins on DDIs, the increasing speeds of interfaces and the highly integrated functions that enable high-resolution displays.
Interview: Innovating Impedance Measurement
Zurich Instruments is a test and measurement company based in Zurich, Switzerland, which develops and produces lock-in amplifiers, phase-locked loops, impedance analyzers, arbitrary waveform generators and boxcar averagers. We talked to Dr Tim Ashworth, Applications Manager at Zurich Instruments, about the latest innovations in impedance analysis and the Mid-Frequency Impedance Analyzer and Precision LCR (MFIA) Meter launched last year.
Compact Vector Network Analyzer for S-Parameter Measurements
29 August 2017 -- Rohde & Schwarz launched the R&S ZNLE vector network analyzer to address the requirements of customers looking to perform RF measurements to characterize components such as antennas, attenuators, filters and PCBs. The new standalone instrument weighs only 6 kg and has a footprint of just 408 mm x 235 mm, saving up to two thirds of space on the workbench compared with competitive VNAs.
Solid-State-Drive Test Solution covers also BIST
25 August 2017 - Advantest has expanded its SSD test coverage with new offerings in the MPT3000 series. With hundreds of systems already installed, the product line is now extended to cover more test insertions including engineering, low-volume production, and built-in self-test (BIST) applications, all with the same MPT3000 architecture and software. The MPT3000 modular, tester-per-DUT (device under test) architecture and unique hardware acceleration, now supports all SSD protocols and form factors.
Contactor for WLCSP Testing in Customer Evaluation
22 August 2017 - Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp.
More Articles ...
- VNAs to Support High Data Rate Requirements of 5G and Data Center Cloud Systems
- Cantilever Contactor Design for MCU and ASIC Testing
- Significant Reduction of Soaking Time during Temperature Tests
- htt Group is official Rep of MPI Probecards Division in Europe, UK and Israel
- Testing High-Resolution Converters, Consumer Audio ICs and IoT Devices
- Cost-Efficient Wafer-Level Testing of Mixed Semiconductor Memories
- Wireless Test System supports 802.11ax, Bluetooth 5, ZigBee and Z-Wave
- Advantest ships 5,000th V93000 Mixed-Signal Test System
- Test of Pressure Sensors for Automotive Applications
- Advantest Europe and Nash Technologies team for Application Engineering Services
- Pick-and-Place Handler with additional Temperature Control Features
- Long-live Spring Probe with 500% for high Volume Production
- LCR Meter with up to 1 MHz Test Frequencies and 0.05% Accuracy
- Advantest extends EVA100 Measurement System
- Sensor Test Module for Twin Axis Stimulation
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