|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsDebug and Trace Support for new Arm Automotive CPUs25 March 2024 — Lauterbach’s TRACE32 tools now also support new leading-edge Arm v9-based Automotive Enhanced (AE) CPUs: the Arm Neoverse-V3AE, Cortex-A720AE, Cortex-A520AE and Cortex-R82AE. TRACE32 support includes simultaneous debugging of the heterogeneous CPU cores as well as non-intrusive CPU trace capture. These platforms are designed to address the exponential growth of software in cars ("Software Defined Vehicle"), the increasing demand for AI in automotive applications, and fundamental changes required in product development and deployment methodologies in order to enable automakers to accelerate time to market. Decode, Trigger & Search Support for the CAN XL Protocol22 March 2024 - Tektronix announced the release of the Tektronix CAN XL (Controller Area Network Extended Length) protocol decoder, enabling engineers incorporating the latest generation of CAN communications, and helping Tektronix customers compete in today’s fast-changing technology landscape. With the ability to decode signals representing data packets transmitted using CAN XL frames in a CAN network, the Tektronix CAN XL protocol decoder runs on today’s 4, 5, 6 Series MSO Oscilloscopes and also offers critical features such as error detection, analysis and debugging of timing and protocol headers. Stackable High Voltage Measurement Modules21 March 2024 - KLARIC launched its new MULTI-HV measurement module family, which is specifically designed for use in high-voltage environments up to 1,500V and offers versatile measurement capabilities for current, voltage, temperature and more. The modules are ideal for use in the automotive industry, particularly in the field of electromobility, and support both CAN and Ethernet interfaces. Verification of ultrafast 5G Communication Solutions20 March 2024 – Anritsu Corporation and MediaTek have verified Advanced three uplink transmission (3TX) Technology featured in MediaTek's M80 5G Modem by using Anritsu's MT8000A all-in-one Radio Communication Test Station, providing a flexible test platform for ultrafast, large-capacity 5G communications. The MT8000A supports sub-6 GHz and mmWave RF tests, as well as protocol tests for development of advanced 5G technologies. 16-bit Function/Arbitrary Waveform Generators19 March 2024 - Rigol's newest high-performance 16-bit RIGOL DG800 Pro and DG900 Pro Function/Arbitrary Waveform Generators series are cost-effective function/arbitrary waveform generators that combine multiple functions including Function Generator, Arbitrary Waveform Generator, Noise Generator, Pulse Generator, Harmonic Generator, Analog/Digital Modulator and Frequency Counter. The Rigol DG800 Pro/DG900 Pro feature up to 625/1250MSa/s sampling and 2/16Mpts/ch memory depth with 16-bit precision. Test Solutions for new EEI Regulation18 March 2024 - Rohde & Schwarz and SmartViser have partnered to develop a solution for testing compliance with a new regulation that will require Energy Efficiency Index (EEI) labeling for smartphones and tablets sold in the EU. At the core of the solution is the R&S CMX500, a radio communication tester that supports end-to-end testing of all signaling use cases, combined with SmartViser’s viSer test automation application – available for Android and iOS. Data Analysis Software with Wizards and other Tools15 March 2024 - imc Test & Measurement, an Axiometrix Solutions brand, released the new imc FAMOS 2024 data analysis software. imc FAMOS 2024 delivers user experience enhancements and extensive updates to its powerful data analysis features for engineers, researchers, and technicians. New features include the Start Page, where users can launch and customize numerous FAMOS wizards and tools; a new data analysis function directly within the curve window, useful for quick evaluation while handling large data sets and advanced formatting options for polar diagrams. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |