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Multi-functional Boundary Scan I/O Modules oimproves Test Coverage

11 November 2014 - GOEPEL electronics presents the CION-LX Module/FXT96, a new boundary scan module with high functionality and dynamics for test of analog, digital and mixed signals. The module allows the extension of boundary scan test to non scannable circuit components such as connectors, clusters or analog interfaces. The standards IEEE1149.1, IEEE1149.6 and IEEE1149.8.1 are supported. There are 96 single-ended, 12 High Current and 24 differential channels available.

Each channel is bi-directional and can be programmed using many different parameters. Unique in the industry, dynamic test resources such as frequency counter, event detector, arbitrary waveform generator or digitizer are available to increase test flexibility. The new model is based on the ASIC CION-LX, a JTAG controllable Mixed Signal Tester-on-Chip (ToC), developed by GOEPEL electronics.

“We set entirely new standards with the new CION LX-Module/FCT96, regarding flexibility and functionality of JTAG controlled I/O modules”, says Heiko Ehrenberg, Technology Officer for Embedded System Access at GOEPEL Electronics USA. “We can offer the customer a simple, safe and affordable solution to enhance their Boundary Scan application significantly. Because of the test resources available per channel, both static and dynamic at-speed-tests are possible – which means significant improvement of structural test coverage and even more flexible test strategies for the customers.”

The CION-LX module can be connected to any Test Access Port (TAP) and can be cascaded to increase the number of channels. It can be operated in combination with other CION modules or ChipVORX modules. In context of the Boundary Scan software platform SYSTEM CASCON a comprehensive automation of the entire project development is possible with minimal effort. Detected errors can be immediately displayed graphically in the layout as part of the Scan Vision tools. The CION-LX Module/FXT96 can be used both for prototype test in the laboratory as well as in production. A live demo of the module can be seen at the electronica show in Munich at booth A1.351.

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