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Testing non-scannable Partitions with Boundary Scan

Goepel SFX 5296LX21 April 2015 - GOEPEL electronics adds a next generation mixed signal I/O module to the JTAG/Boundary Scan hardware platform SCANFLEX. The new SFX-5296LX offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC. The SFX-5296LX is equipped with diverse dynamic test resources for each channel, such as a frequency counter, an event detector, an arbitrary waveform generator and digitizer.

 With a total of 96 single ended channels the Boundary Scan test can be extended to non-scannable components such as connectors, clusters or analog interfaces. To increase flexibility, each channel can be configured as input, output and tri-state and can be easily programmed using many available parameters. These include switchable pull up/pull down or selectable slope steepness for the driver.

The new SFX-5296LX uses the parallel I/O bus and therefore enables much faster data transfer than with serial, via TAP driven I/O modules. Based on the test resources available per channel, both static and dynamic at-speed tests are feasible, allowing a significant improvement of the structural fault coverage along with more flexible test strategies. Thereby only one SFX slot is needed. To increase the number of channels, several modules can be operated simultaneously.

The module is based on the ASIC CION-LX, a multifunctional mixed signal tester on chip (ToC) developed by GOEPEL electronics. The Boundary Scan software SYSTEM CASCON allows full automation of the entire project development, from integration of the module into the tester configuration, to automatic test generation and automatic error diagnosis.

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