This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  


Register to our newsletter
Every two weeks -
all news at a glance

Latest Test and Measurement News

Emission Measurements by a factor of 64 000 times faster

21 February 2014 - The series of ultra-fast and high performance EMI Receivers TDEMI eXtreme (TDEMI X) of GAUSS INSTRUMENTS provides due to a real-time bandwidth of 325 MHz in addition to the classical EMI Receiver mode a variety of measurement and analysis functions. Using leading edge FPGA technology the measurement time can be reduced by a factor of 64 000.

High resolution gigasamples Analog-to-Digital increase the dynamic range by more than 25 dB in comparison to the previous product series TDEMI. Using Multisampling in the frequency range from 30 MHz to 1 GHz a spurious free dynamic range of 100 dB is achieved. In addition to the fast FFT-based measurement mode the instruments also provide a classical superheterodyne mode. The instruments covering several frequency ranges up to 40G and can be used for measurements according to CISPR 16-1-1, MIL461, DO160. In addition to the EMI Receiver mode the TDEMI X Series provides a real-time spectrum analyzer as well as a 2 Channel, 1 GHz, 12 Bit oscilloscope.

GAUSS INSTRUMENTS presents its products at the EMV 2014 in Düsseldorf at Booth CCD-211.

Related Articles:

No related articles found

Upcoming Events

Embedded World 2019
Nuremberg (Germany)
26 to 28 February 2019
Mobile World Congress 2019
Barcelona (Spain)
25 to 28 February 2019
EMV 2018
Stuttgart (Germany)
19 to 21 March 2019

Social Media