|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsRohde & Schwarz expanded R&S RTE Oscilloscope Family27 February 2015 - Rohde & Schwarz announced new models of its R&S RTE oscilloscopes with two- and four-channels and with 1.5 GHz and 2 GHz bandwidth. The product family covers now a bandwidth range from 200 MHz to 2 GHz. Customers can utilize the full bandwidth of an instrument on all available channels simultaneously. The R&S RTE sets new standards in this product class with 5 Gsample/s sampling rate per channel and up to 200 Msample memory. An acquisition rate of more than one million waveforms per second means that signal faults are found very quickly. An extremely low-noise frontend, in conjunction with a sensitivity of up to 500 µV/div and a vertical resolution of 16 bit in high definition mode, ensures highly accurate measurement results. To take full advantage of the high input sensitivity when characterizing low-amplitude signals, the full bandwidth is available even at 500 µV/div, and the instrument displays true sampling points without software-based zooming. The digital trigger system operating in the signal path allows triggering in realtime on even the smallest signal details. Tools such as QuickMeas, which displays the results of eight measurements at the press of a button, fast mask tests, powerful spectrum analysis, the history function as well as 77 automatic measurement functions are provided as standard on the R&S RTE. Results are available extremely fast thanks to the hardware-assisted implementation of the analysis tools in the Rohde & Schwarz ASIC. R&S RTE oscilloscopes support dedicated application solutions for solving complex tasks, including trigger and decoding options for serial protocols and a power analysis option. Every R&S RTE can be upgraded to a high definition oscilloscope with 16 bit vertical resolution via a software license. For analyzing logical components in embedded designs, the mixed signal option offers 16 digital channels with outstanding parameters, including 5 Gsample/s sampling rate and 100 Msample memory per digital channel. The new R&S RTE models are available immediately. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |