This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  


Register to our newsletter
Every two weeks -
all news at a glance

Latest Test and Measurement News

Tunable Laser Sources for Testing Data Center Devices

Keysight 8160xA12 May 2016 – Keysight Technologies introduced the 81602A, an extra high power tunable laser. The 81602A eases tolerance for power budgets in test setups and speeds fiber or probe alignment by getting first light faster. Keysight also introduced new wavelengths for its recently released 8160xA family of tunable laser modules for the 8164B lightwave measurement system.

The new 81602A extra high power tunable laser reaches an optical power level of over +17 dBm (50 mW). The high output power helps compensate for the coupling loss of optical surface probes or the insertion loss of external modulators during the verification of integrated photonic designs. This allows testing photonic devices at relevant signal levels and wavelengths. With a tuning range of 1250 nm to 1370 nm, the laser addresses the latest silicon photonics research.

With the new 8160xA models, manufacturers of LR4 and CWDM receiver optical subassemblies (ROSA) and of optical demultiplexers can improve their test throughput.

81606A and 81608A tunable laser modules with the new option 113 cover the wavelength range from 1240 nm to 1380 nm, and offer a peak output power above +13 dBm with low spontaneous emission. This allows customers to measure spectral response and sensitivity of 100-Gigabit-Ethernet ROSAs well above noise levels, and to verify the isolation of multiplexers/demultiplexers at high measurement dynamic range.

The new option 113 is available for the 81606A, the family’s top line model with a spontaneous emission level 80 dB/nm below the signal, outstanding tuning accuracy and sub-picometer repeatability even at 200-nm/s two-way sweeps. Option 113 is also available for the 81608A value line tunable laser which features ±1.5-pm wavelength repeatability at bidirectional sweeps up to 200 nm/s and offers a spontaneous emission level 75 dB/nm below the signal, as well as for the 81609A basic line, step-tunable laser.

All members of the new tunable laser family are compatible with the current 81600B tunable laser source family programming commands and the N7700A photonic application suite, a solution software for making fast and accurate optical measurements, controlling fiber optic instruments and analyzing measurement results. This makes it easy for engineers to transition smoothly to the new modules or expand their collections to include the new models.

“Silicon photonics researchers and designers of integrated optics who need to surface-probe wafers across a wide wavelength range are faced with challenging signal attenuation,” said Juergen Beck, vice president and general manager of Keysight’s Digital and Photonic Test Division. “The new extra high power O-band tunable laser enables them to characterize and functionally test their designs with real-life signal levels.”

“The massive build-out of data centers leaves transceiver manufacturers with no time to grow their lines’ capacity for 100GbE assemblies,” adds Dr. Joachim Peerlings, senior marketing director of Keysight’s Digital and Photonic Test Division. “By expanding our fast swept-wavelength solutions to the O-band, the new options accelerate high-volume testing of receiver subassemblies and their components with proven measurement methods and software.”

Related Articles:

No related articles found

Upcoming Events

Southern Manufactruing 2019
Farnborough (UK)
05 to 07 February 2019
Embedded World 2019
Nuremberg (Germany)
26 to 28 February 2019
Mobile World Congress 2019
Barcelona (Spain)
25 to 28 February 2019

Social Media