High-Speed Testing of SoCs with Serial, Parallel or Memory Interfaces

11 December 2012 - Advantest introduced its new T2000 8-Gbps Digital Module to address the test requirements of system-on-chip (SoC) devices with high-speed serial, parallel and memory interfaces such as PCI-Express and double data rate (DDR) connections. The T2000 8GDM has the versatility to test a wide range of SoC interfaces while operating at data rates up to 8 Gbps. Key capabilities include clock and data recovery (CDR), jitter injection, I/O dead band cancellation and multi-strobe operation.

The module is available in an Enhanced Performance Package (EPP) capable of functional test abstraction (FTA), which can further shorten cycle times and streamline debugging.

“With its higher density and performance, our new T2000 8GDM positions us to capture even more market share in testing complex SoC devices with high-speed interfaces in multi-time domains,” said Dr. Toshiyuki Okayasu, executive officer and executive vice president of the SoC Test Business Group at Advantest Corporation.“ Both the FTA and EPP features enable system-level functional testing of these targeted semiconductors.”