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Efficient Testing of Semiconductor Devices

Advantest EVA100 DigitalSolution21 November 2017 – Advantest presented the new EVA100 Digital Solution at the Productronica trade show in Munich, Germany, on 14-17 November. The latest member of the EVA100 measurement system’s family tests a broad variety of digital ICs. Available for engineering and production use, the system is capable of design evaluation, wafer sort, package test, DFT test, package validation, IP validation, failure analysis and system level test.

The EVA100 offers unique versatility to test cost-sensitive devices effectively in high-mix, low-volume production environments, ensuring the highest quality standards. The Digital Solution’s capabilities include pattern generation and comparison for evaluating device designs, digital control, power source measurements and 18-bit analog measurements. These tests can be executed at 100-Mbps data-transfer rates and clock speeds up to 200 MHz.

Test programs are generated using the platform’s intuitive GUI. The system enables customers to utilize a common measurement environment from design evaluation through production, achieving efficiency-boosting standardization.

The test unit is compact (W220mm x H206mm x D472mm) and has a maximum of 256 Digital I/O & 16DPS channels. Four units can be clustered together to create configurations of up to 1,024 digital channels. This enables the system to meet market demands for testing MCUs, IoT, Flash, DFT/BIST-driven, small FPGA/ASICs, Fingerprint IC and Digital sensor IC devices.

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