|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsOptical Spectrum Analyzer for High-Power Laser Diode Measurement18 July 2023 - Anritsu Corporation introduced the measurement function (MS9740B-020) for Optical Spectrum Analyzer MS9740B that evaluates a pulsed Laser Diode (LD) chip. The new solution reduces the test time for pulsed LD chip, contributing to improved production efficiency of high-power LD chip. LD chip manufacturers and optical equipment vendors evaluate the optical spectrum of LD chips during manufacturing. Market demand for high-power LD chips is driven by higher communication bit rates and longer LiDAR detection ranges. In addition, new use cases, such as External Laser Small Pluggable (ELSFP) modules for Co-packaged Optics applications, are expected to accelerate demand. The continuous wave (CW) output from a high-power LD chip suffers power drift and wavelength shift as the chip temperature rises. This is prevented by suppressing the temperature rise by using pulsed LD chips. However, current testing of pulsed LD chips during production takes longer because an external trigger signal is required to synchronize with the pulsed LD chip. Rugged Design for any Environment:
www.anritsu.com/ Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |