Takaya introduces new Flying Probe Tester

02 July 2014 - The APT-1400F of Takaya is the next generation Flying Probe Test System of Takaya, the inventor of flying-probe test technology. The new architecture provides average head-speed increases of up to 50% with throughput improvements of 30-50% over existing Takaya models. The completely upgraded XY stage of the APT-1400F, combined with the positioning accuracy from its enhanced optical system, provides a 25% improvement in probing accuracy over the APT-9411.

The APT-1400F main features include:

• Flying 4-Head and Six Z Mechanisms in addition to the four standard moving probes the APT-1400F is designed to use a further two Z mechanisms. These can be either moving Vertical Probes or IC Opens Test Probes. This leads to an unequalled ability to contact difficult test points and contact at different heights.
• Highly Accurate Measurement System includes three 4 Quadrant sources and measurement systems with 16-bit ADC/DAC and AC Programmable generator. Capable of measuring very small capacitance.
• Strong and Rigid XY Stage made from highly polished granite. The XY Stage has been completely reviewed to achieve faster moving speeds with a 25% improvement in positional accuracy.
• Ultrafast Test Speed with the use of new technologies test is speeded up by up to 50%.
• Improved Optical Test System gives AOI functions including Colour, LED, Missing, wrong orientation, positioning error, Barcodes and 2D Barcodes, OCR and Library and Real Map.
• Easy User Friendly Software with the aim to cut down your time to programming Test.

The ability to combine greater functional abilities leave the APT-1400F in a class on its own in Flying Probe Technologies.

The versatility and speed that the platforms present will allow customers to move into production with ease and flexibility.

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